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Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy / R.J Cobley; K.S Teng; M.R Brown; P Rees; S.P Wilks

Applied Surface Science, Volume: 256, Issue: 19, Pages: 5736 - 5739

Swansea University Author: Teng, Vincent

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Published in: Applied Surface Science
ISSN: 0169-4332
Published: 2010
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College: College of Engineering
Issue: 19
Start Page: 5736
End Page: 5739