No Cover Image

Journal article 409 views

Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy / R.J Cobley; K.S Teng; M.R Brown; P Rees; S.P Wilks

Applied Surface Science, Volume: 256, Issue: 19, Pages: 5736 - 5739

Swansea University Author: Teng, Vincent

Full text not available from this repository: check for access using links below.

Published in: Applied Surface Science
ISSN: 0169-4332
Published: 2010
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa12712
Tags: Add Tag
No Tags, Be the first to tag this record!
College: College of Engineering
Issue: 19
Start Page: 5736
End Page: 5739