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Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy / R.J. Cobley; K.S. Teng; M.R. Brown; P. Rees; S.P. Wilks

Applied Surface Science, Volume: 256, Issue: 19, Pages: 5736 - 5739

Swansea University Author: Rees, Paul

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Published in: Applied Surface Science
ISSN: 01694332
Published: 2010
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URI: https://cronfa.swan.ac.uk/Record/cronfa25517
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Item Description: @article rees2010,title = Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy,journal = Applied Surface Science,year = 2010,volume = 256,number = 19,pages = 5736-5739,author = Cobley, R.J. and Teng, K.S. and Brown, M.R. and Rees, P. and Wilks, S.P.
College: College of Engineering
Issue: 19
Start Page: 5736
End Page: 5739