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Journal article 879 views

Application of atomic force microscopy to the study of natural and model soil particles

S CHENG, R BRYANT, S. H DOERR, P. RHODRI WILLIAMS, C. J WRIGHT, Christopher Wright Orcid Logo, Stefan Doerr Orcid Logo

Journal of Microscopy

Swansea University Authors: Christopher Wright Orcid Logo, Stefan Doerr Orcid Logo

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DOI (Published version): 10.1111/j.1365-2818.2008.02051.x

Published in: Journal of Microscopy
Published: 2008
URI: https://cronfa.swan.ac.uk/Record/cronfa7270
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College: Faculty of Science and Engineering