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Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy / R.J. Cobley; K.S. Teng; M.R. Brown; P. Rees; S.P. Wilks

Applied Surface Science, Volume: 256, Issue: 19, Pages: 5736 - 5739

Swansea University Author: Wilks, Steve

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Published in: Applied Surface Science
ISBN: N/A
ISSN: 01694332
Published: 2010
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa5562
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College: College of Science
Issue: 19
Start Page: 5736
End Page: 5739