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Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy / R.J. Cobley; K.S. Teng; M.R. Brown; P. Rees; S.P. Wilks
Applied Surface Science, Volume: 256, Issue: 19, Pages: 5736 - 5739
Swansea University Author: Wilks, Steve
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Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy
|Published in:||Applied Surface Science|
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