No Cover Image

Journal article 399 views

Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy / Rowan Brown

Applied Surface Science

Swansea University Author: Brown, Rowan

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1016/j.apsusc.2010.03.089

Published in: Applied Surface Science
Published: 2010
Tags: Add Tag
No Tags, Be the first to tag this record!
College: College of Engineering