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Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy / Rowan Brown

Applied Surface Science

Swansea University Author: Brown, Rowan

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DOI (Published version): 10.1016/j.apsusc.2010.03.089

Published in: Applied Surface Science
Published: 2010
URI: https://cronfa.swan.ac.uk/Record/cronfa5705
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College: College of Engineering