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The Use of Atomic Force Microscopy in Membrane Characterization

Daniel Johnson Orcid Logo

Comprehensive Membrane Science and Engineering

Swansea University Author: Daniel Johnson Orcid Logo

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DOI (Published version): 10.1016/B978-0-08-093250-7.00025-6

Published in: Comprehensive Membrane Science and Engineering
Published: 2009
URI: https://cronfa.swan.ac.uk/Record/cronfa16505
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last_indexed 2018-02-09T04:49:13Z
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title The Use of Atomic Force Microscopy in Membrane Characterization
spellingShingle The Use of Atomic Force Microscopy in Membrane Characterization
Daniel Johnson
title_short The Use of Atomic Force Microscopy in Membrane Characterization
title_full The Use of Atomic Force Microscopy in Membrane Characterization
title_fullStr The Use of Atomic Force Microscopy in Membrane Characterization
title_full_unstemmed The Use of Atomic Force Microscopy in Membrane Characterization
title_sort The Use of Atomic Force Microscopy in Membrane Characterization
author_id_str_mv 4bdcc306062428d2715b0dd308cc092f
author_id_fullname_str_mv 4bdcc306062428d2715b0dd308cc092f_***_Daniel Johnson
author Daniel Johnson
author2 Daniel Johnson
format Book chapter
container_title Comprehensive Membrane Science and Engineering
publishDate 2009
institution Swansea University
doi_str_mv 10.1016/B978-0-08-093250-7.00025-6
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Uncategorised{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Uncategorised
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published_date 2009-12-31T03:18:51Z
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