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Atomic force microscopy of membranes

William Bowen

Encyclopedia of Surface and Colloid Science 2nd ed, Pages: 850 - 866

Swansea University Author: William Bowen

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DOI (Published version): 10.1081/E-ESCS-120000627

Published in: Encyclopedia of Surface and Colloid Science 2nd ed
Published: Taylor & Francis 2007
URI: https://cronfa.swan.ac.uk/Record/cronfa1807
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Item Description: I pioneered the application of Atomic Force Microscopy (AFM) to engineering problems. This is an invited account of one aspect of this work - AFM studies of synthetic membranes. Such membranes are widely used in industrial separation processes, to very large-scales. The article shows how AFM can be used to quantify all of the membrane properties controlling the operation of such processes. It further shows the use of AFM in the development of new membranes with optimised properties for difficult separations.
College: Faculty of Science and Engineering
Start Page: 850
End Page: 866