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Factors that determine and limit the resistivity of high-quality individual ZnO nanowires

Alex Lord Orcid Logo, Thierry Maffeis Orcid Logo, Alex S Walton, Despoina M Kepaptsoglou, Quentin M Ramasse, Michael B Ward, Jürgen Köble, Steve Wilks

Nanotechnology, Volume: 24, Issue: 43, Start page: 435706

Swansea University Authors: Alex Lord Orcid Logo, Thierry Maffeis Orcid Logo, Steve Wilks

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DOI (Published version): 10.1088/0957-4484/24/43/435706

Published in: Nanotechnology
Published: 2013
URI: https://cronfa.swan.ac.uk/Record/cronfa18529
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College: College of Engineering
Issue: 43
Start Page: 435706