No Cover Image

Journal article 1016 views 281 downloads

The role of probe oxide in local surface conductivity measurements

C. J. Barnett, O. Kryvchenkova, L. S. J. Wilson, T. G. G. Maffeis, K. Kalna, R. J. Cobley, Thierry Maffeis Orcid Logo, Richard Cobley Orcid Logo, Karol Kalna Orcid Logo

Journal of Applied Physics, Volume: 117, Issue: 17, Start page: 174306

Swansea University Authors: Thierry Maffeis Orcid Logo, Richard Cobley Orcid Logo, Karol Kalna Orcid Logo

DOI (Published version): 10.1063/1.4919662

Abstract

Local probe methods can be used to measure nanoscale surface conductivity, but some techniques including nanoscale four point probe rely on at least two of the probes forming the same low resistivity non-rectifying contact to the sample. Here, the role of probe shank oxide has been examined by carry...

Full description

Published in: Journal of Applied Physics
Published: 2015
Online Access: http://scitation.aip.org/content/aip/journal/jap/117/17/10.1063/1.4919662
URI: https://cronfa.swan.ac.uk/Record/cronfa21324
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2015-05-13T02:11:55Z
last_indexed 2019-06-05T09:51:16Z
id cronfa21324
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2019-06-04T16:05:27.4434705</datestamp><bib-version>v2</bib-version><id>21324</id><entry>2015-05-12</entry><title>The role of probe oxide in local surface conductivity measurements</title><swanseaauthors><author><sid>992eb4cb18b61c0cd3da6e0215ac787c</sid><ORCID>0000-0003-2357-0092</ORCID><firstname>Thierry</firstname><surname>Maffeis</surname><name>Thierry Maffeis</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>2ce7e1dd9006164425415a35fa452494</sid><ORCID>0000-0003-4833-8492</ORCID><firstname>Richard</firstname><surname>Cobley</surname><name>Richard Cobley</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>1329a42020e44fdd13de2f20d5143253</sid><ORCID>0000-0002-6333-9189</ORCID><firstname>Karol</firstname><surname>Kalna</surname><name>Karol Kalna</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2015-05-12</date><deptcode>EEEG</deptcode><abstract>Local probe methods can be used to measure nanoscale surface conductivity, but some techniques including nanoscale four point probe rely on at least two of the probes forming the same low resistivity non-rectifying contact to the sample. Here, the role of probe shank oxide has been examined by carrying out contact and non-contact I V measurements on GaAs when the probe oxide has been controllably reduced, both experimentally and in simulation. In contact the barrier height is pinned but the barrier shape changes with probe shank oxide dimensions. In non-contact measurements, the oxide modifies the electrostatic interaction inducing a quantum dot that alters the tunneling behavior. For both, the contact resistance change is dependent on polarity, which violates the assumption required for four point probe to remove probe contact resistance from the measured conductivity. This has implications for all nanoscale surface probe measurements and macroscopic four point probe, both in air and vacuum, where the role of probe oxide contamination is not well understood.</abstract><type>Journal Article</type><journal>Journal of Applied Physics</journal><volume>117</volume><journalNumber>17</journalNumber><paginationStart>174306</paginationStart><publisher/><keywords/><publishedDay>4</publishedDay><publishedMonth>5</publishedMonth><publishedYear>2015</publishedYear><publishedDate>2015-05-04</publishedDate><doi>10.1063/1.4919662</doi><url>http://scitation.aip.org/content/aip/journal/jap/117/17/10.1063/1.4919662</url><notes></notes><college>COLLEGE NANME</college><department>Electronic and Electrical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEEG</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2019-06-04T16:05:27.4434705</lastEdited><Created>2015-05-12T11:20:34.3212364</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering</level></path><authors><author><firstname>C. J.</firstname><surname>Barnett</surname><order>1</order></author><author><firstname>O.</firstname><surname>Kryvchenkova</surname><order>2</order></author><author><firstname>L. S. J.</firstname><surname>Wilson</surname><order>3</order></author><author><firstname>T. G. G.</firstname><surname>Maffeis</surname><order>4</order></author><author><firstname>K.</firstname><surname>Kalna</surname><order>5</order></author><author><firstname>R. J.</firstname><surname>Cobley</surname><order>6</order></author><author><firstname>Thierry</firstname><surname>Maffeis</surname><orcid>0000-0003-2357-0092</orcid><order>7</order></author><author><firstname>Richard</firstname><surname>Cobley</surname><orcid>0000-0003-4833-8492</orcid><order>8</order></author><author><firstname>Karol</firstname><surname>Kalna</surname><orcid>0000-0002-6333-9189</orcid><order>9</order></author></authors><documents><document><filename>0021324-12052015113158.pdf</filename><originalFilename>The__role__of__probe__oxide__in__local__surface__conductivity__measurements.pdf</originalFilename><uploaded>2015-05-12T11:31:58.8600000</uploaded><type>Output</type><contentLength>943287</contentLength><contentType>application/pdf</contentType><version>Accepted Manuscript</version><cronfaStatus>true</cronfaStatus><embargoDate>2015-05-12T00:00:00.0000000</embargoDate><documentNotes/><copyrightCorrect>true</copyrightCorrect></document></documents><OutputDurs/></rfc1807>
spelling 2019-06-04T16:05:27.4434705 v2 21324 2015-05-12 The role of probe oxide in local surface conductivity measurements 992eb4cb18b61c0cd3da6e0215ac787c 0000-0003-2357-0092 Thierry Maffeis Thierry Maffeis true false 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 1329a42020e44fdd13de2f20d5143253 0000-0002-6333-9189 Karol Kalna Karol Kalna true false 2015-05-12 EEEG Local probe methods can be used to measure nanoscale surface conductivity, but some techniques including nanoscale four point probe rely on at least two of the probes forming the same low resistivity non-rectifying contact to the sample. Here, the role of probe shank oxide has been examined by carrying out contact and non-contact I V measurements on GaAs when the probe oxide has been controllably reduced, both experimentally and in simulation. In contact the barrier height is pinned but the barrier shape changes with probe shank oxide dimensions. In non-contact measurements, the oxide modifies the electrostatic interaction inducing a quantum dot that alters the tunneling behavior. For both, the contact resistance change is dependent on polarity, which violates the assumption required for four point probe to remove probe contact resistance from the measured conductivity. This has implications for all nanoscale surface probe measurements and macroscopic four point probe, both in air and vacuum, where the role of probe oxide contamination is not well understood. Journal Article Journal of Applied Physics 117 17 174306 4 5 2015 2015-05-04 10.1063/1.4919662 http://scitation.aip.org/content/aip/journal/jap/117/17/10.1063/1.4919662 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2019-06-04T16:05:27.4434705 2015-05-12T11:20:34.3212364 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering C. J. Barnett 1 O. Kryvchenkova 2 L. S. J. Wilson 3 T. G. G. Maffeis 4 K. Kalna 5 R. J. Cobley 6 Thierry Maffeis 0000-0003-2357-0092 7 Richard Cobley 0000-0003-4833-8492 8 Karol Kalna 0000-0002-6333-9189 9 0021324-12052015113158.pdf The__role__of__probe__oxide__in__local__surface__conductivity__measurements.pdf 2015-05-12T11:31:58.8600000 Output 943287 application/pdf Accepted Manuscript true 2015-05-12T00:00:00.0000000 true
title The role of probe oxide in local surface conductivity measurements
spellingShingle The role of probe oxide in local surface conductivity measurements
Thierry Maffeis
Richard Cobley
Karol Kalna
title_short The role of probe oxide in local surface conductivity measurements
title_full The role of probe oxide in local surface conductivity measurements
title_fullStr The role of probe oxide in local surface conductivity measurements
title_full_unstemmed The role of probe oxide in local surface conductivity measurements
title_sort The role of probe oxide in local surface conductivity measurements
author_id_str_mv 992eb4cb18b61c0cd3da6e0215ac787c
2ce7e1dd9006164425415a35fa452494
1329a42020e44fdd13de2f20d5143253
author_id_fullname_str_mv 992eb4cb18b61c0cd3da6e0215ac787c_***_Thierry Maffeis
2ce7e1dd9006164425415a35fa452494_***_Richard Cobley
1329a42020e44fdd13de2f20d5143253_***_Karol Kalna
author Thierry Maffeis
Richard Cobley
Karol Kalna
author2 C. J. Barnett
O. Kryvchenkova
L. S. J. Wilson
T. G. G. Maffeis
K. Kalna
R. J. Cobley
Thierry Maffeis
Richard Cobley
Karol Kalna
format Journal article
container_title Journal of Applied Physics
container_volume 117
container_issue 17
container_start_page 174306
publishDate 2015
institution Swansea University
doi_str_mv 10.1063/1.4919662
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
url http://scitation.aip.org/content/aip/journal/jap/117/17/10.1063/1.4919662
document_store_str 1
active_str 0
description Local probe methods can be used to measure nanoscale surface conductivity, but some techniques including nanoscale four point probe rely on at least two of the probes forming the same low resistivity non-rectifying contact to the sample. Here, the role of probe shank oxide has been examined by carrying out contact and non-contact I V measurements on GaAs when the probe oxide has been controllably reduced, both experimentally and in simulation. In contact the barrier height is pinned but the barrier shape changes with probe shank oxide dimensions. In non-contact measurements, the oxide modifies the electrostatic interaction inducing a quantum dot that alters the tunneling behavior. For both, the contact resistance change is dependent on polarity, which violates the assumption required for four point probe to remove probe contact resistance from the measured conductivity. This has implications for all nanoscale surface probe measurements and macroscopic four point probe, both in air and vacuum, where the role of probe oxide contamination is not well understood.
published_date 2015-05-04T03:25:15Z
_version_ 1763750880935411712
score 11.016235

Similar Items