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Hybrid 1-D dielectric microcavity: Fabrication and spectroscopic assessment of glass-based sub-wavelength structures

Alessandro Chiasera, Jacek Jasieniak, Simone Normani, Sreeramulu Valligatla, Anna Lukowiak, Stefano Taccheo Orcid Logo, D. Narayana Rao, Giancarlo C. Righini, Marian Marciniak, Alessandro Martucci, Maurizio Ferrari

Ceramics International, Volume: 41, Issue: 6, Pages: 7429 - 7433

Swansea University Author: Stefano Taccheo Orcid Logo

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DOI (Published version): 10.1016/j.ceramint.2015.02.059

Abstract

Two different 1-D multilayer dielectric microcavities are presented, one activated by Er3+ ions fabricated by rf-sputtering and other one containing CdSe@Cd0.5Zn0.5S quantum dots obtained by a hybrid radio frequency-sputtering/solution deposition process. The rare-earth activated cavity is constitut...

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Published in: Ceramics International
Published: 2015
URI: https://cronfa.swan.ac.uk/Record/cronfa21335
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spelling 2018-09-13T16:25:56.4927741 v2 21335 2015-05-12 Hybrid 1-D dielectric microcavity: Fabrication and spectroscopic assessment of glass-based sub-wavelength structures ab5f951bdf448ec045d42a35d95dc0bf 0000-0003-0578-0563 Stefano Taccheo Stefano Taccheo true false 2015-05-12 MECH Two different 1-D multilayer dielectric microcavities are presented, one activated by Er3+ ions fabricated by rf-sputtering and other one containing CdSe@Cd0.5Zn0.5S quantum dots obtained by a hybrid radio frequency-sputtering/solution deposition process. The rare-earth activated cavity is constituted by an Er3+ -doped SiO2 active layer inserted between two Bragg reflectors consisting of 10 pairs of SiO2/TiO2 layers. Starting from the deposition procedure used for this cavity a fabrication protocol was defined with the aim to combine the high reproducibility allowed by the sputtering deposition for the fabrication of multilayers structures with the ability of fabricate films activated with highly luminescent quantum dots dispersed in polymeric matrix. In this case the cavity was constituted by poly-laurylmethacrylate host matrix containing CdSe@Cd0.5Zn0.5S quantum dots inserted between two Bragg reflectors consisting of 10 pairs of SiO2/TiO2 layers fabricated by rf-sputtering on SiO2 substrate. The thicknesses of the films of the Bragg reflectors were tailored in order to reflect the visible radiation at around 650 nm. Transmittance spectra were employed to assess the optical features of the single Bragg gratings and whole samples. Luminescence measurements put in evidence that emissions strongly influenced by the presence of the cavities for both the samples. Journal Article Ceramics International 41 6 7429 7433 31 7 2015 2015-07-31 10.1016/j.ceramint.2015.02.059 COLLEGE NANME Mechanical Engineering COLLEGE CODE MECH Swansea University 2018-09-13T16:25:56.4927741 2015-05-12T15:52:46.6208178 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering Alessandro Chiasera 1 Jacek Jasieniak 2 Simone Normani 3 Sreeramulu Valligatla 4 Anna Lukowiak 5 Stefano Taccheo 0000-0003-0578-0563 6 D. Narayana Rao 7 Giancarlo C. Righini 8 Marian Marciniak 9 Alessandro Martucci 10 Maurizio Ferrari 11
title Hybrid 1-D dielectric microcavity: Fabrication and spectroscopic assessment of glass-based sub-wavelength structures
spellingShingle Hybrid 1-D dielectric microcavity: Fabrication and spectroscopic assessment of glass-based sub-wavelength structures
Stefano Taccheo
title_short Hybrid 1-D dielectric microcavity: Fabrication and spectroscopic assessment of glass-based sub-wavelength structures
title_full Hybrid 1-D dielectric microcavity: Fabrication and spectroscopic assessment of glass-based sub-wavelength structures
title_fullStr Hybrid 1-D dielectric microcavity: Fabrication and spectroscopic assessment of glass-based sub-wavelength structures
title_full_unstemmed Hybrid 1-D dielectric microcavity: Fabrication and spectroscopic assessment of glass-based sub-wavelength structures
title_sort Hybrid 1-D dielectric microcavity: Fabrication and spectroscopic assessment of glass-based sub-wavelength structures
author_id_str_mv ab5f951bdf448ec045d42a35d95dc0bf
author_id_fullname_str_mv ab5f951bdf448ec045d42a35d95dc0bf_***_Stefano Taccheo
author Stefano Taccheo
author2 Alessandro Chiasera
Jacek Jasieniak
Simone Normani
Sreeramulu Valligatla
Anna Lukowiak
Stefano Taccheo
D. Narayana Rao
Giancarlo C. Righini
Marian Marciniak
Alessandro Martucci
Maurizio Ferrari
format Journal article
container_title Ceramics International
container_volume 41
container_issue 6
container_start_page 7429
publishDate 2015
institution Swansea University
doi_str_mv 10.1016/j.ceramint.2015.02.059
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering
document_store_str 0
active_str 0
description Two different 1-D multilayer dielectric microcavities are presented, one activated by Er3+ ions fabricated by rf-sputtering and other one containing CdSe@Cd0.5Zn0.5S quantum dots obtained by a hybrid radio frequency-sputtering/solution deposition process. The rare-earth activated cavity is constituted by an Er3+ -doped SiO2 active layer inserted between two Bragg reflectors consisting of 10 pairs of SiO2/TiO2 layers. Starting from the deposition procedure used for this cavity a fabrication protocol was defined with the aim to combine the high reproducibility allowed by the sputtering deposition for the fabrication of multilayers structures with the ability of fabricate films activated with highly luminescent quantum dots dispersed in polymeric matrix. In this case the cavity was constituted by poly-laurylmethacrylate host matrix containing CdSe@Cd0.5Zn0.5S quantum dots inserted between two Bragg reflectors consisting of 10 pairs of SiO2/TiO2 layers fabricated by rf-sputtering on SiO2 substrate. The thicknesses of the films of the Bragg reflectors were tailored in order to reflect the visible radiation at around 650 nm. Transmittance spectra were employed to assess the optical features of the single Bragg gratings and whole samples. Luminescence measurements put in evidence that emissions strongly influenced by the presence of the cavities for both the samples.
published_date 2015-07-31T03:25:16Z
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score 11.012678