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Triple junction distribution profiles as assessed by electron backscatter diffraction / Helen Davies

Journal of Materials Science, Volume: 37, Issue: 19, Pages: 4203 - 4209

Swansea University Author: Helen Davies

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DOI (Published version): 10.1023/A:1020052306493

Published in: Journal of Materials Science
Published: 2002
URI: https://cronfa.swan.ac.uk/Record/cronfa23356
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College: College of Engineering
Issue: 19
Start Page: 4203
End Page: 4209