Journal article 998 views
Triple junction distribution profiles as assessed by electron backscatter diffraction
Helen Davies 
Journal of Materials Science, Volume: 37, Issue: 19, Pages: 4203 - 4209
Swansea University Author:
Helen Davies
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DOI (Published version): 10.1023/A:1020052306493
Abstract
Triple junction distribution profiles as assessed by electron backscatter diffraction
| Published in: | Journal of Materials Science |
|---|---|
| Published: |
2002
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa23356 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
19 |
| Start Page: |
4203 |
| End Page: |
4209 |