No Cover Image

Journal article 599 views

Triple junction distribution profiles as assessed by electron backscatter diffraction

Helen Davies Orcid Logo

Journal of Materials Science, Volume: 37, Issue: 19, Pages: 4203 - 4209

Swansea University Author: Helen Davies Orcid Logo

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1023/A:1020052306493

Published in: Journal of Materials Science
Published: 2002
Tags: Add Tag
No Tags, Be the first to tag this record!
College: College of Engineering
Issue: 19
Start Page: 4203
End Page: 4209