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Single-section plane assessment in grain boundary engineered brass / H. Davies, V. Randle, Helen Davies

Journal of Microscopy, Volume: 205, Issue: 3, Pages: 253 - 258

Swansea University Author: Helen Davies

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DOI (Published version): 10.1046/j.1365-2818.2002.00989.x

Published in: Journal of Microscopy
Published: 2002
URI: https://cronfa.swan.ac.uk/Record/cronfa23357
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College: College of Engineering
Issue: 3
Start Page: 253
End Page: 258