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Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging
Structural Dynamics, Volume: 3, Issue: 2, Start page: 023612
Swansea University Author: William Bryan
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DOI (Published version): 10.1063/1.4947098
Abstract
Femtosecond electron microscopy produces real-space images of matter in a series ofultrafast snapshots. Pulses of electrons self-disperse under space-charge broadening,so without compression, the ideal operation mode is a single electron per pulse. Here,we demonstrate femtosecond single-electron poi...
Published in: | Structural Dynamics |
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ISSN: | 2329-7778 |
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2016
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URI: | https://cronfa.swan.ac.uk/Record/cronfa27343 |
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2020-06-25T17:00:04.5387112 v2 27343 2016-04-20 Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging 8765729ae362887eb6653857658f2342 0000-0002-2278-055X William Bryan William Bryan true false 2016-04-20 BGPS Femtosecond electron microscopy produces real-space images of matter in a series ofultrafast snapshots. Pulses of electrons self-disperse under space-charge broadening,so without compression, the ideal operation mode is a single electron per pulse. Here,we demonstrate femtosecond single-electron point projection microscopy (fs-ePPM)in a laser-pump fs-e-probe configuration. The electrons have an energy of only150 eV and take tens of picoseconds to propagate to the object under study.Nonetheless, we achieve a temporal resolution with a standard deviation of 114 fs(equivalent to a full-width at half-maximum of 269 +/- 40 fs) combined with a spatialresolution of 100 nm, applied to a localized region of charge at the apex of a nanoscalemetal tip induced by 30 fs 800 nm laser pulses at 50 kHz. These observations demonstratereal-space imaging of reversible processes, such as tracking charge distributions,is feasible whilst maintaining femtosecond resolution. Our findings could find applicationas a characterization method, which, depending on geometry, could resolve tensof femtoseconds and tens of nanometres. Dynamically imaging electric and magneticfields and charge distributions on sub-micron length scales opens new avenues ofultrafast dynamics. Furthermore, through the use of active compression, such pulsesare an ideal seed for few-femtosecond to attosecond imaging applications which willaccess sub-optical cycle processes in nanoplasmonics. Journal Article Structural Dynamics 3 2 023612 2329-7778 femtosecond electron microscopy, nanoscale dynamic imaging, ultrafast electron microscopy, single electron pulses 20 4 2016 2016-04-20 10.1063/1.4947098 COLLEGE NANME Biosciences Geography and Physics School COLLEGE CODE BGPS Swansea University 2020-06-25T17:00:04.5387112 2016-04-20T17:36:52.7127985 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics A. R. Bainbridge 1 C. W. Barlow Myers 2 W. A. Bryan 3 William Bryan 0000-0002-2278-055X 4 0027343-02072018153039.pdf BainbridgeFemtosecondFew2016.pdf 2018-07-02T15:30:39.4670000 Output 4115691 application/pdf Version of Record true 2018-07-02T00:00:00.0000000 licensed under a Creative Commons Attribution 3.0 Unported License true eng |
title |
Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
spellingShingle |
Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging William Bryan |
title_short |
Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title_full |
Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title_fullStr |
Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title_full_unstemmed |
Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
title_sort |
Femtosecond few- to single-electron point-projection microscopy for nanoscale dynamic imaging |
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8765729ae362887eb6653857658f2342 |
author_id_fullname_str_mv |
8765729ae362887eb6653857658f2342_***_William Bryan |
author |
William Bryan |
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A. R. Bainbridge C. W. Barlow Myers W. A. Bryan William Bryan |
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Structural Dynamics |
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2016 |
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Swansea University |
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2329-7778 |
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10.1063/1.4947098 |
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description |
Femtosecond electron microscopy produces real-space images of matter in a series ofultrafast snapshots. Pulses of electrons self-disperse under space-charge broadening,so without compression, the ideal operation mode is a single electron per pulse. Here,we demonstrate femtosecond single-electron point projection microscopy (fs-ePPM)in a laser-pump fs-e-probe configuration. The electrons have an energy of only150 eV and take tens of picoseconds to propagate to the object under study.Nonetheless, we achieve a temporal resolution with a standard deviation of 114 fs(equivalent to a full-width at half-maximum of 269 +/- 40 fs) combined with a spatialresolution of 100 nm, applied to a localized region of charge at the apex of a nanoscalemetal tip induced by 30 fs 800 nm laser pulses at 50 kHz. These observations demonstratereal-space imaging of reversible processes, such as tracking charge distributions,is feasible whilst maintaining femtosecond resolution. Our findings could find applicationas a characterization method, which, depending on geometry, could resolve tensof femtoseconds and tens of nanometres. Dynamically imaging electric and magneticfields and charge distributions on sub-micron length scales opens new avenues ofultrafast dynamics. Furthermore, through the use of active compression, such pulsesare an ideal seed for few-femtosecond to attosecond imaging applications which willaccess sub-optical cycle processes in nanoplasmonics. |
published_date |
2016-04-20T06:52:00Z |
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11.047306 |