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Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy / Katherine Hooper; H. K. H. Lee; Michael Newman; Simone Meroni; Jenny Baker; Trystan Watson; Wing Chung Tsoi

Physical Chemistry Chemical Physics, Volume: 19, Issue: 7, Pages: 5246 - 5253

Swansea University Authors: Katherine, Hooper, Michael, Newman, Simone, Meroni, Jenny, Baker, Trystan, Watson, Wing Chung, Tsoi

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DOI (Published version): 10.1039/c6cp05123e

Abstract

The key challenges for perovskite solar cells include their poor stability and film homogeneity. Studying the degradation and homogeneity of perovskite layers within device structures can be challenging but critical to the understanding of stability and effect of processing in real life conditions....

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Published in: Physical Chemistry Chemical Physics
ISSN: 1463-9076 1463-9084
Published: 2017
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URI: https://cronfa.swan.ac.uk/Record/cronfa31892
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Studying the degradation and homogeneity of perovskite layers within device structures can be challenging but critical to the understanding of stability and effect of processing in real life conditions. We show that Raman spectroscopy (RS) is a unique and powerful method (simple and fast) to probe the degradation of the perovskite film within the device structure and image perovskite formation. We demonstrate that RS can be used to directly probe chemical (PbI2) and physical (dihydrated phase) degradation of a perovskite film, and estimate the relative amount of the degradation species formed, mapping its distribution with &#x223C;1 &#x3BC;m spatial resolution. This has been applied to mapping a large area perovskite module to characterise the efficacy of PbI2 to perovskite conversion. We also use RS to study the degradation species and kinetics under diverse accelerated degradation conditions (temperature and humidity) in situ. 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spelling 2021-01-14T13:13:20.6297524 v2 31892 2017-02-09 Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy 3607f6787dc810c0ed1fdc49ea2b5e63 Katherine Hooper Katherine Hooper true false 051a4bb1b12de491967ad8f0a0bece3c Michael Newman Michael Newman true false 78a4cf80ab2fe6cca80716b5d357d8dd 0000-0002-6901-772X Simone Meroni Simone Meroni true false 6913b56f36f0c8cd34d8c9040d2df460 0000-0003-3530-1957 Jenny Baker Jenny Baker true false a210327b52472cfe8df9b8108d661457 0000-0002-8015-1436 Trystan Watson Trystan Watson true false 7e5f541df6635a9a8e1a579ff2de5d56 0000-0003-3836-5139 Wing Chung Tsoi Wing Chung Tsoi true false 2017-02-09 EEN The key challenges for perovskite solar cells include their poor stability and film homogeneity. Studying the degradation and homogeneity of perovskite layers within device structures can be challenging but critical to the understanding of stability and effect of processing in real life conditions. We show that Raman spectroscopy (RS) is a unique and powerful method (simple and fast) to probe the degradation of the perovskite film within the device structure and image perovskite formation. We demonstrate that RS can be used to directly probe chemical (PbI2) and physical (dihydrated phase) degradation of a perovskite film, and estimate the relative amount of the degradation species formed, mapping its distribution with ∼1 μm spatial resolution. This has been applied to mapping a large area perovskite module to characterise the efficacy of PbI2 to perovskite conversion. We also use RS to study the degradation species and kinetics under diverse accelerated degradation conditions (temperature and humidity) in situ. These capabilities are difficult to achieve with other methods, presenting RS as an important tool to gain understanding of the degradation and effect of processing on perovskite-based photovoltaic devices. Journal Article Physical Chemistry Chemical Physics 19 7 5246 5253 1463-9076 1463-9084 2 2 2017 2017-02-02 10.1039/c6cp05123e COLLEGE NANME Engineering COLLEGE CODE EEN Swansea University 2021-01-14T13:13:20.6297524 2017-02-09T09:10:51.5697157 College of Engineering Engineering Katherine Hooper 1 H. K. H. Lee 2 Michael Newman 3 Simone Meroni 0000-0002-6901-772X 4 Jenny Baker 0000-0003-3530-1957 5 Trystan Watson 0000-0002-8015-1436 6 Wing Chung Tsoi 0000-0003-3836-5139 7 0031892-09022017091200.pdf hooper2017.pdf 2017-02-09T09:12:00.1030000 Output 837616 application/pdf Accepted Manuscript true 2018-02-02T00:00:00.0000000 true eng
title Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy
spellingShingle Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy
Katherine, Hooper
Michael, Newman
Simone, Meroni
Jenny, Baker
Trystan, Watson
Wing Chung, Tsoi
title_short Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy
title_full Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy
title_fullStr Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy
title_full_unstemmed Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy
title_sort Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy
author_id_str_mv 3607f6787dc810c0ed1fdc49ea2b5e63
051a4bb1b12de491967ad8f0a0bece3c
78a4cf80ab2fe6cca80716b5d357d8dd
6913b56f36f0c8cd34d8c9040d2df460
a210327b52472cfe8df9b8108d661457
7e5f541df6635a9a8e1a579ff2de5d56
author_id_fullname_str_mv 3607f6787dc810c0ed1fdc49ea2b5e63_***_Katherine, Hooper
051a4bb1b12de491967ad8f0a0bece3c_***_Michael, Newman
78a4cf80ab2fe6cca80716b5d357d8dd_***_Simone, Meroni
6913b56f36f0c8cd34d8c9040d2df460_***_Jenny, Baker
a210327b52472cfe8df9b8108d661457_***_Trystan, Watson
7e5f541df6635a9a8e1a579ff2de5d56_***_Wing Chung, Tsoi
author Katherine, Hooper
Michael, Newman
Simone, Meroni
Jenny, Baker
Trystan, Watson
Wing Chung, Tsoi
author2 Katherine Hooper
H. K. H. Lee
Michael Newman
Simone Meroni
Jenny Baker
Trystan Watson
Wing Chung Tsoi
format Journal article
container_title Physical Chemistry Chemical Physics
container_volume 19
container_issue 7
container_start_page 5246
publishDate 2017
institution Swansea University
issn 1463-9076
1463-9084
doi_str_mv 10.1039/c6cp05123e
college_str College of Engineering
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hierarchy_top_title College of Engineering
hierarchy_parent_id collegeofengineering
hierarchy_parent_title College of Engineering
department_str Engineering{{{_:::_}}}College of Engineering{{{_:::_}}}Engineering
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description The key challenges for perovskite solar cells include their poor stability and film homogeneity. Studying the degradation and homogeneity of perovskite layers within device structures can be challenging but critical to the understanding of stability and effect of processing in real life conditions. We show that Raman spectroscopy (RS) is a unique and powerful method (simple and fast) to probe the degradation of the perovskite film within the device structure and image perovskite formation. We demonstrate that RS can be used to directly probe chemical (PbI2) and physical (dihydrated phase) degradation of a perovskite film, and estimate the relative amount of the degradation species formed, mapping its distribution with ∼1 μm spatial resolution. This has been applied to mapping a large area perovskite module to characterise the efficacy of PbI2 to perovskite conversion. We also use RS to study the degradation species and kinetics under diverse accelerated degradation conditions (temperature and humidity) in situ. These capabilities are difficult to achieve with other methods, presenting RS as an important tool to gain understanding of the degradation and effect of processing on perovskite-based photovoltaic devices.
published_date 2017-02-02T03:46:02Z
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