On maximum likelihood estimation for the two parameter Weibull distribution
| Date first appeared online | |
| DOI | 10.1016/0026-2714(95)00171-9 |
| Authors | Watkins A. |
| Journal Name | Microelectronics Reliability |
| Volume | 36 |
| Date first appeared online | |
| DOI | 10.1016/0026-2714(95)00171-9 |
| Authors | Watkins A. |
| Journal Name | Microelectronics Reliability |
| Volume | 36 |