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On the analysis of accelerated life-testing experiments

Alan Watkins Orcid Logo

IEEE Transactions on Reliability, Volume: 40, Issue: 1, Pages: 98 - 101

Swansea University Author: Alan Watkins Orcid Logo

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DOI (Published version): 10.1109/24.75343

Published in: IEEE Transactions on Reliability
ISSN: 00189529
Published: 1991
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College: Faculty of Medicine, Health and Life Sciences
Issue: 1
Start Page: 98
End Page: 101