Journal article 983 views
Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy
Chemical Communications, Volume: 52, Issue: 53, Pages: 8227 - 8230
Swansea University Author:
Deb Roy
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1039/c6cc01990k
Abstract
Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy
Published in: | Chemical Communications |
---|---|
ISSN: | 1359-7345 1364-548X |
Published: |
Royal Society of Chemistry (RSC)
2016
|
Online Access: |
Check full text
|
URI: | https://cronfa.swan.ac.uk/Record/cronfa37209 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
College: |
Faculty of Science and Engineering |
---|---|
Issue: |
53 |
Start Page: |
8227 |
End Page: |
8230 |