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Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy

Weitao Su, Naresh Kumar, Ning Dai, Deb Roy Orcid Logo

Chemical Communications, Volume: 52, Issue: 53, Pages: 8227 - 8230

Swansea University Author: Deb Roy Orcid Logo

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DOI (Published version): 10.1039/c6cc01990k

Published in: Chemical Communications
ISSN: 1359-7345 1364-548X
Published: Royal Society of Chemistry (RSC) 2016
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College: Faculty of Science and Engineering
Issue: 53
Start Page: 8227
End Page: 8230