Journal article 828 views
Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
Naresh Kumar,
Alasdair Rae,
Deb Roy 
Applied Physics Letters, Volume: 104, Issue: 12, Start page: 123106
Swansea University Author:
Deb Roy
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1063/1.4869184
Abstract
Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
| Published in: | Applied Physics Letters |
|---|---|
| ISSN: | 0003-6951 1077-3118 |
| Published: |
2014
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa37215 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
12 |
| Start Page: |
123106 |