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Atomically resolved real-space imaging of hot electron dynamics

D. Lock, K. R. Rusimova, T. L. Pan, R. E. Palmer, P. A. Sloan, Richard Palmer Orcid Logo

Nature Communications, Volume: 6, Issue: 1

Swansea University Author: Richard Palmer Orcid Logo

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DOI (Published version): 10.1038/ncomms9365

Abstract

The dynamics of hot electrons are central to understanding the properties of many electronic devices. But their ultra-short lifetime, typically 100 fs or less, and correspondingly short transport length-scale in the nanometre range constrain real-space investigations. Here we report variable tempera...

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Published in: Nature Communications
ISSN: 2041-1723 2041-1723
Published: 2015
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URI: https://cronfa.swan.ac.uk/Record/cronfa39514
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Abstract: The dynamics of hot electrons are central to understanding the properties of many electronic devices. But their ultra-short lifetime, typically 100 fs or less, and correspondingly short transport length-scale in the nanometre range constrain real-space investigations. Here we report variable temperature and voltage measurements of the nonlocal manipulation of adsorbed molecules on the Si(111)-7 × 7 surface in the scanning tunnelling microscope. The range of the nonlocal effect increases with temperature and, at constant temperature, is invariant over a wide range of electron energies. The measurements probe, in real space, the underlying hot electron dynamics on the 10 nm scale and are well described by a two-dimensional diffusive model with a single decay channel, consistent with 2-photon photo-emission (2PPE) measurements of the real time dynamics.
Keywords: Condensed-matter physics, Reaction kinetics and dynamics, Scanning probe microscopy
College: College of Engineering
Issue: 1