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Defect profiling with low energy positrons of nitrogen implanted silicon
Swansea University Author: Dirk van der Werf
Abstract
Defect profiling with low energy positrons of nitrogen implanted silicon
Published: |
1997
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URI: | https://cronfa.swan.ac.uk/Record/cronfa45343 |
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<?xml version="1.0"?><rfc1807><datestamp>2018-10-30T18:42:02.4028670</datestamp><bib-version>v2</bib-version><id>45343</id><entry>2018-10-30</entry><title>Defect profiling with low energy positrons of nitrogen implanted silicon</title><swanseaauthors><author><sid>4a4149ebce588e432f310f4ab44dd82a</sid><ORCID>0000-0001-5436-5214</ORCID><firstname>Dirk</firstname><surname>van der Werf</surname><name>Dirk van der Werf</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2018-10-30</date><deptcode>SPH</deptcode><abstract/><type>Book</type><journal></journal><volume></volume><journalNumber></journalNumber><paginationStart/><paginationEnd/><publisher/><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>1997</publishedYear><publishedDate>1997-12-31</publishedDate><doi/><url/><notes/><college>COLLEGE NANME</college><department>Physics</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SPH</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2018-10-30T18:42:02.4028670</lastEdited><Created>2018-10-30T18:42:02.4028670</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Biosciences, Geography and Physics - Physics</level></path><authors><author><firstname>Dirk</firstname><surname>van der Werf</surname><orcid>0000-0001-5436-5214</orcid><order>1</order></author></authors><documents/><OutputDurs/></rfc1807> |
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2018-10-30T18:42:02.4028670 v2 45343 2018-10-30 Defect profiling with low energy positrons of nitrogen implanted silicon 4a4149ebce588e432f310f4ab44dd82a 0000-0001-5436-5214 Dirk van der Werf Dirk van der Werf true false 2018-10-30 SPH Book 31 12 1997 1997-12-31 COLLEGE NANME Physics COLLEGE CODE SPH Swansea University 2018-10-30T18:42:02.4028670 2018-10-30T18:42:02.4028670 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics Dirk van der Werf 0000-0001-5436-5214 1 |
title |
Defect profiling with low energy positrons of nitrogen implanted silicon |
spellingShingle |
Defect profiling with low energy positrons of nitrogen implanted silicon Dirk van der Werf |
title_short |
Defect profiling with low energy positrons of nitrogen implanted silicon |
title_full |
Defect profiling with low energy positrons of nitrogen implanted silicon |
title_fullStr |
Defect profiling with low energy positrons of nitrogen implanted silicon |
title_full_unstemmed |
Defect profiling with low energy positrons of nitrogen implanted silicon |
title_sort |
Defect profiling with low energy positrons of nitrogen implanted silicon |
author_id_str_mv |
4a4149ebce588e432f310f4ab44dd82a |
author_id_fullname_str_mv |
4a4149ebce588e432f310f4ab44dd82a_***_Dirk van der Werf |
author |
Dirk van der Werf |
author2 |
Dirk van der Werf |
format |
Book |
publishDate |
1997 |
institution |
Swansea University |
college_str |
Faculty of Science and Engineering |
hierarchytype |
|
hierarchy_top_id |
facultyofscienceandengineering |
hierarchy_top_title |
Faculty of Science and Engineering |
hierarchy_parent_id |
facultyofscienceandengineering |
hierarchy_parent_title |
Faculty of Science and Engineering |
department_str |
School of Biosciences, Geography and Physics - Physics{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Biosciences, Geography and Physics - Physics |
document_store_str |
0 |
active_str |
0 |
published_date |
1997-12-31T03:57:06Z |
_version_ |
1763752884756807680 |
score |
11.036706 |