Journal article 828 views
Probing and Controlling Intragrain Crystallinity for Improved Low Temperature-Processed Perovskite Solar Cells
Advanced Functional Materials, Volume: 28, Issue: 51, Start page: 1803943
Swansea University Author: James Durrant
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DOI (Published version): 10.1002/adfm.201803943
Abstract
Here, previously unobserved nanoscale defects residing within individual grains of solution‐processed methylammonium lead tri‐iodide (CH3NH3PbI3, MAPI) thin films are identified. Using scanning transmission electron microscopy (STEM), the defects inherently associated with the established solution‐p...
Published in: | Advanced Functional Materials |
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ISSN: | 1616-301X |
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Wiley
2018
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URI: | https://cronfa.swan.ac.uk/Record/cronfa45968 |
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2018-11-19T14:28:28Z |
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2024-11-14T11:55:48Z |
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2023-06-02T15:11:20.7790265 v2 45968 2018-11-19 Probing and Controlling Intragrain Crystallinity for Improved Low Temperature-Processed Perovskite Solar Cells f3dd64bc260e5c07adfa916c27dbd58a 0000-0001-8353-7345 James Durrant James Durrant true false 2018-11-19 EAAS Here, previously unobserved nanoscale defects residing within individual grains of solution‐processed methylammonium lead tri‐iodide (CH3NH3PbI3, MAPI) thin films are identified. Using scanning transmission electron microscopy (STEM), the defects inherently associated with the established solution‐processing methodology are identified, and a facile processing modification to eliminate these defects is introduced. Specifically, defect elimination is achieved by coannealing the as‐deposited MAPI layer with the electron transport layer (phenyl‐C61‐butyric acid methyl, PCBM) resulting in devices that significantly outperform devices prepared using the established methodology—with power conversion efficiencies increasing from 13.6% to 17.4%. The use of transmission electron microscopy allows the correlation of performance enhancements to improved intragrain crystallinity and shows that highly coherent crystallographic orientation results within individual grains when processing is modified. Detailed optoelectronic characterization reveals that the improved intragrain crystallinity drives an improvement of charge collection and a reduction of PEDOT:PSS/perovskite interfacial recombination. The study suggests that the microstructural defects in MAPI, owing to a lack of structural coherence throughout the thickness of thin film, are a significant cause of interfacial recombination. Journal Article Advanced Functional Materials 28 51 1803943 Wiley 1616-301X 1 12 2018 2018-12-01 10.1002/adfm.201803943 http://dx.doi.org/10.1002/adfm.201803943 COLLEGE NANME Engineering and Applied Sciences School COLLEGE CODE EAAS Swansea University 2023-06-02T15:11:20.7790265 2018-11-19T09:43:16.4985399 Faculty of Science and Engineering School of Engineering and Applied Sciences - Materials Science and Engineering Tian Du 1 Claire H. Burgess 2 Chieh-Ting Lin 3 Flurin Eisner 4 Jinhyun Kim 5 Shengda Xu 6 Hongkyu Kang 0000-0003-2890-9710 7 James Durrant 0000-0001-8353-7345 8 Martyn A. McLachlan 0000-0003-3136-1661 9 |
title |
Probing and Controlling Intragrain Crystallinity for Improved Low Temperature-Processed Perovskite Solar Cells |
spellingShingle |
Probing and Controlling Intragrain Crystallinity for Improved Low Temperature-Processed Perovskite Solar Cells James Durrant |
title_short |
Probing and Controlling Intragrain Crystallinity for Improved Low Temperature-Processed Perovskite Solar Cells |
title_full |
Probing and Controlling Intragrain Crystallinity for Improved Low Temperature-Processed Perovskite Solar Cells |
title_fullStr |
Probing and Controlling Intragrain Crystallinity for Improved Low Temperature-Processed Perovskite Solar Cells |
title_full_unstemmed |
Probing and Controlling Intragrain Crystallinity for Improved Low Temperature-Processed Perovskite Solar Cells |
title_sort |
Probing and Controlling Intragrain Crystallinity for Improved Low Temperature-Processed Perovskite Solar Cells |
author_id_str_mv |
f3dd64bc260e5c07adfa916c27dbd58a |
author_id_fullname_str_mv |
f3dd64bc260e5c07adfa916c27dbd58a_***_James Durrant |
author |
James Durrant |
author2 |
Tian Du Claire H. Burgess Chieh-Ting Lin Flurin Eisner Jinhyun Kim Shengda Xu Hongkyu Kang James Durrant Martyn A. McLachlan |
format |
Journal article |
container_title |
Advanced Functional Materials |
container_volume |
28 |
container_issue |
51 |
container_start_page |
1803943 |
publishDate |
2018 |
institution |
Swansea University |
issn |
1616-301X |
doi_str_mv |
10.1002/adfm.201803943 |
publisher |
Wiley |
college_str |
Faculty of Science and Engineering |
hierarchytype |
|
hierarchy_top_id |
facultyofscienceandengineering |
hierarchy_top_title |
Faculty of Science and Engineering |
hierarchy_parent_id |
facultyofscienceandengineering |
hierarchy_parent_title |
Faculty of Science and Engineering |
department_str |
School of Engineering and Applied Sciences - Materials Science and Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Materials Science and Engineering |
url |
http://dx.doi.org/10.1002/adfm.201803943 |
document_store_str |
0 |
active_str |
0 |
description |
Here, previously unobserved nanoscale defects residing within individual grains of solution‐processed methylammonium lead tri‐iodide (CH3NH3PbI3, MAPI) thin films are identified. Using scanning transmission electron microscopy (STEM), the defects inherently associated with the established solution‐processing methodology are identified, and a facile processing modification to eliminate these defects is introduced. Specifically, defect elimination is achieved by coannealing the as‐deposited MAPI layer with the electron transport layer (phenyl‐C61‐butyric acid methyl, PCBM) resulting in devices that significantly outperform devices prepared using the established methodology—with power conversion efficiencies increasing from 13.6% to 17.4%. The use of transmission electron microscopy allows the correlation of performance enhancements to improved intragrain crystallinity and shows that highly coherent crystallographic orientation results within individual grains when processing is modified. Detailed optoelectronic characterization reveals that the improved intragrain crystallinity drives an improvement of charge collection and a reduction of PEDOT:PSS/perovskite interfacial recombination. The study suggests that the microstructural defects in MAPI, owing to a lack of structural coherence throughout the thickness of thin film, are a significant cause of interfacial recombination. |
published_date |
2018-12-01T01:53:05Z |
_version_ |
1822002705906794496 |
score |
11.048042 |