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A combined transient photovoltage and impedance spectroscopy approach for a comprehensive study of interlayer degradation in non-fullerene acceptor organic solar cells

Adam Pockett, Harrison Ka Hin Lee, Brendan L. Coles, Wing C. Tsoi, Matt Carnie Orcid Logo, Wing Chung Tsoi Orcid Logo

Nanoscale

Swansea University Authors: Adam Pockett, Matt Carnie Orcid Logo, Wing Chung Tsoi Orcid Logo

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DOI (Published version): 10.1039/c9nr02337b

Abstract

Organic solar cells utilise thin interlayer materials between the active layer and metal electrodes to improve stability and performance. In this work, we combine transient photovoltage (TPV) and impedance spectroscopy (EIS) measurements to study how degradation affects both the active layer and the...

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Published in: Nanoscale
ISSN: 2040-3364 2040-3372
Published: Royal Society of Chemistry 2019
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URI: https://cronfa.swan.ac.uk/Record/cronfa50351
first_indexed 2019-05-14T14:00:19Z
last_indexed 2019-06-05T20:54:25Z
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spelling 2019-06-05T15:23:50.8558077 v2 50351 2019-05-14 A combined transient photovoltage and impedance spectroscopy approach for a comprehensive study of interlayer degradation in non-fullerene acceptor organic solar cells de06433fccc0514dcf45aa9d1fc5c60f Adam Pockett Adam Pockett true false 73b367694366a646b90bb15db32bb8c0 0000-0002-4232-1967 Matt Carnie Matt Carnie true false 7e5f541df6635a9a8e1a579ff2de5d56 0000-0003-3836-5139 Wing Chung Tsoi Wing Chung Tsoi true false 2019-05-14 EAAS Organic solar cells utilise thin interlayer materials between the active layer and metal electrodes to improve stability and performance. In this work, we combine transient photovoltage (TPV) and impedance spectroscopy (EIS) measurements to study how degradation affects both the active layer and the interlayer. We show that neither technique alone can provide a complete insight into both of these regions: TPV is more suited to studying degradation of the active layer; EIS clearly identifies the properties of the interlayer. By analysing both of these approaches we are able to assess how different interlayers impact the stability of the active layer, as well as how the interlayers themselves degrade and severely limit device performance. EIS measurements are also able to resolve the impact of the interlayer on series resistance even when it is not apparent from standard current–voltage (JV) measurements. The technique could therefore be valuable for the optimisation of all devices. Journal Article Nanoscale Royal Society of Chemistry 2040-3364 2040-3372 31 12 2019 2019-12-31 10.1039/c9nr02337b COLLEGE NANME Engineering and Applied Sciences School COLLEGE CODE EAAS Swansea University RCUK 2019-06-05T15:23:50.8558077 2019-05-14T10:52:22.6982448 Faculty of Science and Engineering School of Engineering and Applied Sciences - Materials Science and Engineering Adam Pockett 1 Harrison Ka Hin Lee 2 Brendan L. Coles 3 Wing C. Tsoi 4 Matt Carnie 0000-0002-4232-1967 5 Wing Chung Tsoi 0000-0003-3836-5139 6 0050351-05062019152336.pdf pockett2019(2).pdf 2019-06-05T15:23:36.9700000 Output 5538935 application/pdf Version of Record true 2019-06-05T00:00:00.0000000 false eng
title A combined transient photovoltage and impedance spectroscopy approach for a comprehensive study of interlayer degradation in non-fullerene acceptor organic solar cells
spellingShingle A combined transient photovoltage and impedance spectroscopy approach for a comprehensive study of interlayer degradation in non-fullerene acceptor organic solar cells
Adam Pockett
Matt Carnie
Wing Chung Tsoi
title_short A combined transient photovoltage and impedance spectroscopy approach for a comprehensive study of interlayer degradation in non-fullerene acceptor organic solar cells
title_full A combined transient photovoltage and impedance spectroscopy approach for a comprehensive study of interlayer degradation in non-fullerene acceptor organic solar cells
title_fullStr A combined transient photovoltage and impedance spectroscopy approach for a comprehensive study of interlayer degradation in non-fullerene acceptor organic solar cells
title_full_unstemmed A combined transient photovoltage and impedance spectroscopy approach for a comprehensive study of interlayer degradation in non-fullerene acceptor organic solar cells
title_sort A combined transient photovoltage and impedance spectroscopy approach for a comprehensive study of interlayer degradation in non-fullerene acceptor organic solar cells
author_id_str_mv de06433fccc0514dcf45aa9d1fc5c60f
73b367694366a646b90bb15db32bb8c0
7e5f541df6635a9a8e1a579ff2de5d56
author_id_fullname_str_mv de06433fccc0514dcf45aa9d1fc5c60f_***_Adam Pockett
73b367694366a646b90bb15db32bb8c0_***_Matt Carnie
7e5f541df6635a9a8e1a579ff2de5d56_***_Wing Chung Tsoi
author Adam Pockett
Matt Carnie
Wing Chung Tsoi
author2 Adam Pockett
Harrison Ka Hin Lee
Brendan L. Coles
Wing C. Tsoi
Matt Carnie
Wing Chung Tsoi
format Journal article
container_title Nanoscale
publishDate 2019
institution Swansea University
issn 2040-3364
2040-3372
doi_str_mv 10.1039/c9nr02337b
publisher Royal Society of Chemistry
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Materials Science and Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Materials Science and Engineering
document_store_str 1
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description Organic solar cells utilise thin interlayer materials between the active layer and metal electrodes to improve stability and performance. In this work, we combine transient photovoltage (TPV) and impedance spectroscopy (EIS) measurements to study how degradation affects both the active layer and the interlayer. We show that neither technique alone can provide a complete insight into both of these regions: TPV is more suited to studying degradation of the active layer; EIS clearly identifies the properties of the interlayer. By analysing both of these approaches we are able to assess how different interlayers impact the stability of the active layer, as well as how the interlayers themselves degrade and severely limit device performance. EIS measurements are also able to resolve the impact of the interlayer on series resistance even when it is not apparent from standard current–voltage (JV) measurements. The technique could therefore be valuable for the optimisation of all devices.
published_date 2019-12-31T02:01:45Z
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