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The τ-plot, a multicomponent 1-D pole figure plot, to quantify the heterogeneity of plastic deformation / Thomas Simm, Y.B. Das, A.N. Forsey, S. Gungor, M.E. Fitzpatrick, Leo Prakash, R.J. Moat, Soran Birosca, J. Quinta da Fonseca, Karen Perkins

Materials Characterization, Volume: 160, Start page: 110114

Swansea University Authors: Thomas Simm, Leo Prakash, Soran Birosca, Karen Perkins

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Abstract

An approach is presented that allows multi-scale characterisations of heterogeneous deformation in crystalline materials by employing a range of characterisation techniques including: electron backscatter diffraction, digital image correlation and neutron diffraction powder measurements. The approac...

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Published in: Materials Characterization
ISSN: 1044-5803
Published: Elsevier BV 2020
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URI: https://cronfa.swan.ac.uk/Record/cronfa53163
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Abstract: An approach is presented that allows multi-scale characterisations of heterogeneous deformation in crystalline materials by employing a range of characterisation techniques including: electron backscatter diffraction, digital image correlation and neutron diffraction powder measurements. The approach will be used to obtain critical information about the variations in parameters that characterise the deformed state in different crystallographic orientation texture components of a sample in a statistically significant way. These parameters include lattice strains, texture evolution, peak broadening, dislocation density, planar faults, phase changes and surface strain. This approach allows verification of models of plastic deformation to provide a more detailed view of plastic deformation heterogeneity at multiple length scales than obtained by other characterisation approaches. The approach demonstrated here is applied to two stainless steel alloys; an alloy that exhibits phase transformation during deformation and an alloy that remains the same phase all through deformation process.
Keywords: TRIP steel, Digital image correlation, Electron backscatter diffraction, Neutron diffraction, Diffraction peak profile analysis, Planar faults
Start Page: 110114