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Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration

David Gethin Orcid Logo, Tim Claypole Orcid Logo, Eifion Jewell Orcid Logo, Christopher Phillips Orcid Logo

Measurement Science and Technology

Swansea University Authors: David Gethin Orcid Logo, Tim Claypole Orcid Logo, Eifion Jewell Orcid Logo, Christopher Phillips Orcid Logo

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DOI (Published version): 10.1088/0957-0233/19/2/025703

Published in: Measurement Science and Technology
Published: 2008
URI: https://cronfa.swan.ac.uk/Record/cronfa5350
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first_indexed 2013-07-23T11:52:19Z
last_indexed 2018-02-09T04:31:34Z
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spelling 2011-10-01T00:00:00.0000000 v2 5350 2013-09-03 Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration 20b93675a5457203ae87ebc32bd6d155 0000-0002-7142-8253 David Gethin David Gethin true false 7735385522f1e68a8775b4f709e91d55 0000-0003-1393-9634 Tim Claypole Tim Claypole true false 13dc152c178d51abfe0634445b0acf07 0000-0002-6894-2251 Eifion Jewell Eifion Jewell true false cc734f776f10b3fb9b43816c9f617bb5 0000-0001-8011-710X Christopher Phillips Christopher Phillips true false 2013-09-03 MECH Journal Article Measurement Science and Technology 31 12 2008 2008-12-31 10.1088/0957-0233/19/2/025703 COLLEGE NANME Mechanical Engineering COLLEGE CODE MECH Swansea University 2011-10-01T00:00:00.0000000 2013-09-03T06:01:08.0000000 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering David Gethin 0000-0002-7142-8253 1 Tim Claypole 0000-0003-1393-9634 2 Eifion Jewell 0000-0002-6894-2251 3 Christopher Phillips 0000-0001-8011-710X 4
title Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
spellingShingle Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
David Gethin
Tim Claypole
Eifion Jewell
Christopher Phillips
title_short Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
title_full Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
title_fullStr Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
title_full_unstemmed Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
title_sort Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
author_id_str_mv 20b93675a5457203ae87ebc32bd6d155
7735385522f1e68a8775b4f709e91d55
13dc152c178d51abfe0634445b0acf07
cc734f776f10b3fb9b43816c9f617bb5
author_id_fullname_str_mv 20b93675a5457203ae87ebc32bd6d155_***_David Gethin
7735385522f1e68a8775b4f709e91d55_***_Tim Claypole
13dc152c178d51abfe0634445b0acf07_***_Eifion Jewell
cc734f776f10b3fb9b43816c9f617bb5_***_Christopher Phillips
author David Gethin
Tim Claypole
Eifion Jewell
Christopher Phillips
author2 David Gethin
Tim Claypole
Eifion Jewell
Christopher Phillips
format Journal article
container_title Measurement Science and Technology
publishDate 2008
institution Swansea University
doi_str_mv 10.1088/0957-0233/19/2/025703
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering
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published_date 2008-12-31T03:09:59Z
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