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Refining understanding of corporate failure through a topological data analysis mapping of Altman’s Z-score model

Wanling Qiu, Simon Rudkin Orcid Logo, Pawel Dlotko Orcid Logo

Expert Systems with Applications, Volume: 156, Start page: 113475

Swansea University Authors: Wanling Qiu, Simon Rudkin Orcid Logo, Pawel Dlotko Orcid Logo

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Published in: Expert Systems with Applications
ISSN: 0957-4174
Published: 2020
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa54202
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Keywords: Credit scoring; Topological data analysis; Data visualization; Bankruptcy prediction
College: School of Management
Start Page: 113475