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Refining understanding of corporate failure through a topological data analysis mapping of Altman’s Z-score model / Wanling Qiu, Simon Rudkin, Pawel Dlotko

Expert Systems with Applications, Volume: 156, Start page: 113475

Swansea University Authors: Wanling Qiu, Simon Rudkin, Pawel Dlotko

  • Accepted Manuscript under embargo until: 27th October 2021
Published in: Expert Systems with Applications
ISSN: 0957-4174
Published: 2020
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa54202
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Keywords: Credit scoring; Topological data analysis; Data visualization; Bankruptcy prediction
College: School of Management
Start Page: 113475