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Refining understanding of corporate failure through a topological data analysis mapping of Altman’s Z-score model
Wanling Qiu,
Simon Rudkin 
,
Pawel Dlotko
,
Pawel Dlotko
Expert Systems with Applications, Volume: 156, Start page: 113475
Swansea University Authors:
Wanling Qiu, Simon Rudkin , Pawel Dlotko
-
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DOI (Published version): 10.1016/j.eswa.2020.113475
Abstract
Refining understanding of corporate failure through a topological data analysis mapping of Altman’s Z-score model
| Published in: | Expert Systems with Applications |
|---|---|
| ISSN: | 0957-4174 |
| Published: |
2020
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa54202 |
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| Keywords: |
Credit scoring; Topological data analysis; Data visualization; Bankruptcy prediction |
|---|---|
| College: |
Faculty of Humanities and Social Sciences |
| Start Page: |
113475 |