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The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors
Advanced Optical Materials, Volume: 8, Issue: 16, Start page: 2000319
Swansea University Authors: Robin Kerremans, Wei Li, Nasim Zarrabi, Paul Meredith , Ardalan Armin
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DOI (Published version): 10.1002/adom.202000319
Abstract
Accurate determination of the optical constants of thin film solids has been an ongoing endeavor in optoelectronics and related fields for decades. These constants, namely the refractive index and extinction (or attenuation) coefficient, are the fundamental material properties that dictate electroma...
Published in: | Advanced Optical Materials |
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ISSN: | 2195-1071 2195-1071 |
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2020
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URI: | https://cronfa.swan.ac.uk/Record/cronfa54426 |
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These constants, namely the refractive index and extinction (or attenuation) coefficient, are the fundamental material properties that dictate electromagnetic field propagation in any medium. They form the inputs to well-established models that allow for design and optimization of multilayer stack structures such as thin film solar cells, light-emitting diodes, and photodetectors. These determinations are particularly challenging for materials that are scattering and highly absorbing. In this work, a new and resource-efficient approach for optical constant determination based upon transmission spectrophotometry in combination with an iterative, reverse transfer matrix model and the Kramers–Kronig relation is reported. The approach is validated using more conventional ellipsometry for a number of functionally important semiconductors, including the recently emergent organic non-fullerene electron acceptors (NFAs) and perovskites for which the optical constants in the UV–vis–near IR region are provided. Notably, the NFAs are found to present anomalously high refractive indices and extinction coefficients that are predicted to have a profound influence on the cavity electro-optics of the new record efficiency organic solar cells of which they are key components.</abstract><type>Journal Article</type><journal>Advanced Optical Materials</journal><volume>8</volume><journalNumber>16</journalNumber><paginationStart>2000319</paginationStart><paginationEnd/><publisher>Wiley</publisher><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint>2195-1071</issnPrint><issnElectronic>2195-1071</issnElectronic><keywords/><publishedDay>1</publishedDay><publishedMonth>8</publishedMonth><publishedYear>2020</publishedYear><publishedDate>2020-08-01</publishedDate><doi>10.1002/adom.202000319</doi><url>http://dx.doi.org/10.1002/adom.202000319</url><notes/><college>COLLEGE NANME</college><department>Physics</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SPH</DepartmentCode><institution>Swansea University</institution><apcterm>SU Library paid the OA fee (TA Institutional Deal)</apcterm><funders>This work was funded by the Welsh Government's Sêr Cymru II Program (Sustainable Advanced Materials) through the European Regional Development Fund and Welsh European Funding Office. R.K. and C.K. are the recipients of EPSRC DTP postgraduate awards. P.M. is a Sêr Cymru II Research Chair and A.A. a Sêr Cymru II Rising Star Fellow.</funders><projectreference/><lastEdited>2022-08-09T16:08:56.6978580</lastEdited><Created>2020-06-10T14:35:18.5424921</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Biosciences, Geography and Physics - Physics</level></path><authors><author><firstname>Robin</firstname><surname>Kerremans</surname><order>1</order></author><author><firstname>Christina</firstname><surname>Kaiser</surname><order>2</order></author><author><firstname>Wei</firstname><surname>Li</surname><order>3</order></author><author><firstname>Nasim</firstname><surname>Zarrabi</surname><order>4</order></author><author><firstname>Paul</firstname><surname>Meredith</surname><orcid>0000-0002-9049-7414</orcid><order>5</order></author><author><firstname>Ardalan</firstname><surname>Armin</surname><orcid>0000-0002-6129-5354</orcid><order>6</order></author></authors><documents><document><filename>54426__17456__2139dde944d74314b7621238940c408e.pdf</filename><originalFilename>Kerremans 2020.pdf</originalFilename><uploaded>2020-06-10T14:35:46.9405173</uploaded><type>Output</type><contentLength>3191366</contentLength><contentType>application/pdf</contentType><version>Version of Record</version><cronfaStatus>true</cronfaStatus><documentNotes>This is an open access article under the terms of the Creative
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2022-08-09T16:08:56.6978580 v2 54426 2020-06-10 The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors ceb23b4837db851ac099a7d2762b341c Robin Kerremans Robin Kerremans true false d6c46502d8e5f62c1af3c7fce334ac90 Wei Li Wei Li true false d20976a5892074dae0368a4bb4433f76 Nasim Zarrabi Nasim Zarrabi true false 31e8fe57fa180d418afd48c3af280c2e 0000-0002-9049-7414 Paul Meredith Paul Meredith true false 22b270622d739d81e131bec7a819e2fd 0000-0002-6129-5354 Ardalan Armin Ardalan Armin true false 2020-06-10 SPH Accurate determination of the optical constants of thin film solids has been an ongoing endeavor in optoelectronics and related fields for decades. These constants, namely the refractive index and extinction (or attenuation) coefficient, are the fundamental material properties that dictate electromagnetic field propagation in any medium. They form the inputs to well-established models that allow for design and optimization of multilayer stack structures such as thin film solar cells, light-emitting diodes, and photodetectors. These determinations are particularly challenging for materials that are scattering and highly absorbing. In this work, a new and resource-efficient approach for optical constant determination based upon transmission spectrophotometry in combination with an iterative, reverse transfer matrix model and the Kramers–Kronig relation is reported. The approach is validated using more conventional ellipsometry for a number of functionally important semiconductors, including the recently emergent organic non-fullerene electron acceptors (NFAs) and perovskites for which the optical constants in the UV–vis–near IR region are provided. Notably, the NFAs are found to present anomalously high refractive indices and extinction coefficients that are predicted to have a profound influence on the cavity electro-optics of the new record efficiency organic solar cells of which they are key components. Journal Article Advanced Optical Materials 8 16 2000319 Wiley 2195-1071 2195-1071 1 8 2020 2020-08-01 10.1002/adom.202000319 http://dx.doi.org/10.1002/adom.202000319 COLLEGE NANME Physics COLLEGE CODE SPH Swansea University SU Library paid the OA fee (TA Institutional Deal) This work was funded by the Welsh Government's Sêr Cymru II Program (Sustainable Advanced Materials) through the European Regional Development Fund and Welsh European Funding Office. R.K. and C.K. are the recipients of EPSRC DTP postgraduate awards. P.M. is a Sêr Cymru II Research Chair and A.A. a Sêr Cymru II Rising Star Fellow. 2022-08-09T16:08:56.6978580 2020-06-10T14:35:18.5424921 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics Robin Kerremans 1 Christina Kaiser 2 Wei Li 3 Nasim Zarrabi 4 Paul Meredith 0000-0002-9049-7414 5 Ardalan Armin 0000-0002-6129-5354 6 54426__17456__2139dde944d74314b7621238940c408e.pdf Kerremans 2020.pdf 2020-06-10T14:35:46.9405173 Output 3191366 application/pdf Version of Record true This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited. true |
title |
The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors |
spellingShingle |
The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors Robin Kerremans Wei Li Nasim Zarrabi Paul Meredith Ardalan Armin |
title_short |
The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors |
title_full |
The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors |
title_fullStr |
The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors |
title_full_unstemmed |
The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors |
title_sort |
The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors |
author_id_str_mv |
ceb23b4837db851ac099a7d2762b341c d6c46502d8e5f62c1af3c7fce334ac90 d20976a5892074dae0368a4bb4433f76 31e8fe57fa180d418afd48c3af280c2e 22b270622d739d81e131bec7a819e2fd |
author_id_fullname_str_mv |
ceb23b4837db851ac099a7d2762b341c_***_Robin Kerremans d6c46502d8e5f62c1af3c7fce334ac90_***_Wei Li d20976a5892074dae0368a4bb4433f76_***_Nasim Zarrabi 31e8fe57fa180d418afd48c3af280c2e_***_Paul Meredith 22b270622d739d81e131bec7a819e2fd_***_Ardalan Armin |
author |
Robin Kerremans Wei Li Nasim Zarrabi Paul Meredith Ardalan Armin |
author2 |
Robin Kerremans Christina Kaiser Wei Li Nasim Zarrabi Paul Meredith Ardalan Armin |
format |
Journal article |
container_title |
Advanced Optical Materials |
container_volume |
8 |
container_issue |
16 |
container_start_page |
2000319 |
publishDate |
2020 |
institution |
Swansea University |
issn |
2195-1071 2195-1071 |
doi_str_mv |
10.1002/adom.202000319 |
publisher |
Wiley |
college_str |
Faculty of Science and Engineering |
hierarchytype |
|
hierarchy_top_id |
facultyofscienceandengineering |
hierarchy_top_title |
Faculty of Science and Engineering |
hierarchy_parent_id |
facultyofscienceandengineering |
hierarchy_parent_title |
Faculty of Science and Engineering |
department_str |
School of Biosciences, Geography and Physics - Physics{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Biosciences, Geography and Physics - Physics |
url |
http://dx.doi.org/10.1002/adom.202000319 |
document_store_str |
1 |
active_str |
0 |
description |
Accurate determination of the optical constants of thin film solids has been an ongoing endeavor in optoelectronics and related fields for decades. These constants, namely the refractive index and extinction (or attenuation) coefficient, are the fundamental material properties that dictate electromagnetic field propagation in any medium. They form the inputs to well-established models that allow for design and optimization of multilayer stack structures such as thin film solar cells, light-emitting diodes, and photodetectors. These determinations are particularly challenging for materials that are scattering and highly absorbing. In this work, a new and resource-efficient approach for optical constant determination based upon transmission spectrophotometry in combination with an iterative, reverse transfer matrix model and the Kramers–Kronig relation is reported. The approach is validated using more conventional ellipsometry for a number of functionally important semiconductors, including the recently emergent organic non-fullerene electron acceptors (NFAs) and perovskites for which the optical constants in the UV–vis–near IR region are provided. Notably, the NFAs are found to present anomalously high refractive indices and extinction coefficients that are predicted to have a profound influence on the cavity electro-optics of the new record efficiency organic solar cells of which they are key components. |
published_date |
2020-08-01T04:07:57Z |
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1763753567478349824 |
score |
11.016235 |