Jennings, M., Li, F., Jokubavicius, V., Yakimova, R., Tomás, A. P., Russell, S., . . . Via, F. L. (2019). Electrical Characterisation of Thick 3C-SiC Layers Grown on Off-Axis 4H-SiC Substrates. Materials Science Forum, 963, pp. 353-356. doi:10.4028/www.scientific.net/msf.963.353
Chicago Style CitationJennings, Mike, et al. "Electrical Characterisation of Thick 3C-SiC Layers Grown On Off-Axis 4H-SiC Substrates." Materials Science Forum 963 (2019): 353-356.
MLA CitationJennings, Mike, et al. "Electrical Characterisation of Thick 3C-SiC Layers Grown On Off-Axis 4H-SiC Substrates." Materials Science Forum 963 (2019): 353-356.
Warning: These citations may not always be 100% accurate.