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Effect of Scanning Acceleration on the Leakage Signal in Magnetic Flux Leakage Type of Non-destructive Testing
Journal of Nondestructive Evaluation, Volume: 42, Issue: 1
Swansea University Authors: Lintao Zhang, Paul Ledger, Fawzi Belblidia , Johann Sienz
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DOI (Published version): 10.1007/s10921-023-00925-1
This work investigates the influence of acceleration on the leakage signal in magnetic flux leakage type of non-destructive testing. The research is addressed through both designed experiments and simulations. The results showed that the leakage signal, represented by using peak to peak value, decre...
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This work investigates the influence of acceleration on the leakage signal in magnetic flux leakage type of non-destructive testing. The research is addressed through both designed experiments and simulations. The results showed that the leakage signal, represented by using peak to peak value, decreases between 15.1% and 26.6% under acceleration. The simulation results indicated that the main reason for the decrease is due to the difference in the distortion of the magnetic field for cases with and without acceleration, which is the result of the different eddy current distributions in the specimen. The findings will help to allow the optimisation of a magnetic flux leakage system to ensure that main defect features can be measured more accurately during the machine acceleration phase of scanning. It also shows the importance of conducting measurements at constant velocity, wherever possible.
Non-destructive Testing (NDT); Magnetic flux leakge (MFL); Leakage signal (peak to peak); Scanning acceleration
Faculty of Science and Engineering
The authors would like to acknowledge the ASTUTE 2020 (Advanced Sustainable Manufacturing Technologies) operation supporting manufacturing companies across Wales, which has been part-funded by the European Regional Development Fund through the Welsh Government and the participating Higher Education Institutions. The authors would also like to acknowledge the contribution of Eddyfi Technologies.