E-Thesis 550 views 210 downloads
Exploring adaptations of the carbon layer of the triple mesoscopic carbon perovskite solar cell / MARK CUSHWORTH
Swansea University Author: MARK CUSHWORTH
Abstract
This thesis explores possibilities for the improvement of the carbon layer within the triple mesoscopic carbon perovskite solar cell (mCPSC) architecture used in SPECIFIC labs at Swansea University. An increase in sheet resistance, resistivity and contact resistance is found in GEM carbon layers, wi...
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Swansea, Wales, UK
2023
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| Institution: | Swansea University |
| Degree level: | Master of Research |
| Degree name: | MSc by Research |
| Supervisor: | Watson, Trystan. |
| URI: | https://cronfa.swan.ac.uk/Record/cronfa63667 |
| Abstract: |
This thesis explores possibilities for the improvement of the carbon layer within the triple mesoscopic carbon perovskite solar cell (mCPSC) architecture used in SPECIFIC labs at Swansea University. An increase in sheet resistance, resistivity and contact resistance is found in GEM carbon layers, within the mCPSC, as a result of annealing heat treatments and perovskite infiltration compared to carbon layers dried at 100°C. A unique application of a printed carbon capping layer, utilising the lower sheet resistance, contact resistance and higher mechanical robustness of the dried GEM carbon layer, is used in mCPSC devices. Devices with this capping layer are found to have increased fill factor, by 5-10%. Work function of the GEM carbon layer is enhanced with the addition of WO3 particles with improvements up to 5% PCE seen in devices that contained WO3 particles in the carbon layer. These devices have increased FF, VOC and JSC when compared to standard GEM devices. As well as possible enhancements of the carbon layer with GEM carbon ink, alternative carbon inks made in-house and sourced from commercial manufacturers are compared for use as the screen-printed carbon layer in the mCPSC. The comparisons are based on the following characterisation techniques: four-point probe measurements to calculate carbon layer sheet resistance and resistivity; profilometry to assess printed layer thickness and surface roughness; the Transmission Line Method (TLM) to find contact resistance at the interface between printed carbon layers and FTO substrate; Adhesion tape test is used to assess mechanical robustness of the carbon layer and Kelvin probe measurements are used to calculate the work-function of the carbon layer. |
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| College: |
Faculty of Science and Engineering |