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Conference Paper/Proceeding/Abstract 389 views

Deep BIAS: Detecting Structural Bias using Explainable AI

Bas Van Stein Orcid Logo, Diederick Vermetten Orcid Logo, Fabio Caraffini Orcid Logo, Anna V. Kononova Orcid Logo

Proceedings of the Companion Conference on Genetic and Evolutionary Computation

Swansea University Author: Fabio Caraffini Orcid Logo

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DOI (Published version): 10.1145/3583133.3590551

Published in: Proceedings of the Companion Conference on Genetic and Evolutionary Computation
Published: New York, NY, USA ACM 2023
Online Access: http://dx.doi.org/10.1145/3583133.3590551
URI: https://cronfa.swan.ac.uk/Record/cronfa63992
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College: Faculty of Science and Engineering