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Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template

Y. Zhang, J. Bai, Yaonan Hou, R. M. Smith Orcid Logo, X. Yu Orcid Logo, Y. Gong, T. Wang

AIP Advances, Volume: 6, Issue: 2

Swansea University Author: Yaonan Hou

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DOI (Published version): 10.1063/1.4941444

Published in: AIP Advances
ISSN: 2158-3226
Published: AIP Publishing 2016
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URI: https://cronfa.swan.ac.uk/Record/cronfa65310
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College: Faculty of Science and Engineering
Issue: 2