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Measurements of Penning-Malmberg trap patch potentials and associated performance degradation

Christopher Baker Orcid Logo, W. Bertsche, A. Capra, C. L. Cesar, Michael Charlton, A. Christensen Orcid Logo, R. Collister, April Cridland Orcid Logo, Stefan Eriksson Orcid Logo, A. Evans, N. Evetts, J. Fajans, T. Friesen, M. C. Fujiwara, D. R. Gill, P. Grandemange, P. Granum, J. S. Hangst, M. E. Hayden, D. Hodgkinson, E. D. Hunter, Christopher Aled Isaac Orcid Logo, M. A. Johnson, Jack Jones, S. A. Jones, S. Jonsell, A. Khramov, L. Kurchaninov, H. Landsberger, Niels Madsen Orcid Logo, Daniel Maxwell Orcid Logo, J. T. K. McKenna, S. Menary, T. Momose, Patrick Mullan, J. J. Munich, K. Olchanski, A. Olin, JOANNA PESZKA, A. Powell, P. Pusa, C.Ø. Rasmussen, F. Robicheaux, R. L. Sacramento, M. Sameed, E. Sarid, D. M. Silveira, C. So, G. Stutter, T. D. Tharp, R. I. Thompson, C. Torkzaban, Dirk van der Werf Orcid Logo, E. Ward, J. S. Wurtele, (ALPHA Collaboration)

Physical Review Research, Volume: 6, Issue: 1

Swansea University Authors: Christopher Baker Orcid Logo, Michael Charlton, April Cridland Orcid Logo, Stefan Eriksson Orcid Logo, Christopher Aled Isaac Orcid Logo, Jack Jones, Niels Madsen Orcid Logo, Daniel Maxwell Orcid Logo, Patrick Mullan, JOANNA PESZKA, Dirk van der Werf Orcid Logo

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Abstract

Antiprotons created by laser ionization of antihydrogen are observed to rapidly escape the ALPHA trap. Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential...

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Published in: Physical Review Research
ISSN: 2643-1564
Published: American Physical Society (APS) 2024
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa65508
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Abstract: Antiprotons created by laser ionization of antihydrogen are observed to rapidly escape the ALPHA trap. Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential along metal surfaces. A simple model of the effects of patch potentials explains the particle loss, and an experimental technique using trapped electrons is developed for measuring the electric field produced by the patch potentials. The model is validated by controlled experiments and simulations.
College: Faculty of Science and Engineering
Funders: EPSRC
Issue: 1