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Exciton diffusion in organic semiconductors: precision and pitfalls
Nanoscale
Swansea University Authors:
Drew Riley, Paul Meredith , Ardalan Armin
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DOI (Published version): 10.1039/d4nr02467b
Abstract
Nanometer exciton diffusion is a fundamental process important in virtually all applications of organic semiconductors. Many measurement techniques have been developed to measure exciton diffusion length (LD) at the nanometer scale; however, these techniques have common challenges that the community...
Published in: | Nanoscale |
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ISSN: | 2040-3364 2040-3372 |
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The Royal Society of Chemistry
2024
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URI: | https://cronfa.swan.ac.uk/Record/cronfa67452 |
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<?xml version="1.0" encoding="utf-8"?><rfc1807 xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:xsd="http://www.w3.org/2001/XMLSchema"><bib-version>v2</bib-version><id>67452</id><entry>2024-08-23</entry><title>Exciton diffusion in organic semiconductors: precision and pitfalls</title><swanseaauthors><author><sid>edca1c48f922393fa2b3cb84d8dc0e4a</sid><firstname>Drew</firstname><surname>Riley</surname><name>Drew Riley</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>31e8fe57fa180d418afd48c3af280c2e</sid><ORCID>0000-0002-9049-7414</ORCID><firstname>Paul</firstname><surname>Meredith</surname><name>Paul Meredith</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>22b270622d739d81e131bec7a819e2fd</sid><firstname>Ardalan</firstname><surname>Armin</surname><name>Ardalan Armin</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2024-08-23</date><deptcode>BGPS</deptcode><abstract>Nanometer exciton diffusion is a fundamental process important in virtually all applications of organic semiconductors. Many measurement techniques have been developed to measure exciton diffusion length (LD) at the nanometer scale; however, these techniques have common challenges that the community has worked for decades to overcome. In this perspective, we lay out the principal challenges researchers need to overcome to obtain an accurate measurement of LD. We then examine the most common techniques used to measure LD with respect to these challenges and describe solutions developed to overcome them. This analysis leads to the suggestion that static quenching techniques underestimate LD due to uncertainties in the quenching behavior, while time-resolved exciton–exciton annihilation (EEA) techniques overestimate LD based on experimental conditions, we advance steady-state EEA techniques as an alternative that overcome many of the challenges of these other techniques while preserving accuracy. We support this hypothesis with a meta-analysis of LD measured across various organic semiconductors and measurement techniques. We intend this investigation to provide a framework for researchers to interpret and compare findings across measurement techniques and to guide researchers on how to obtain the most accurate results for each technique in question.</abstract><type>Journal Article</type><journal>Nanoscale</journal><volume>0</volume><journalNumber/><paginationStart/><paginationEnd/><publisher>The Royal Society of Chemistry</publisher><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint>2040-3364</issnPrint><issnElectronic>2040-3372</issnElectronic><keywords>Organic semiconductors</keywords><publishedDay>13</publishedDay><publishedMonth>8</publishedMonth><publishedYear>2024</publishedYear><publishedDate>2024-08-13</publishedDate><doi>10.1039/d4nr02467b</doi><url/><notes>Mini Review</notes><college>COLLEGE NANME</college><department>Biosciences Geography and Physics School</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>BGPS</DepartmentCode><institution>Swansea University</institution><apcterm>SU Library paid the OA fee (TA Institutional Deal)</apcterm><funders>European Regional Development Fund Grant: Unassigned Identifier: doi https://doi.org/10.13039/501100008530 Swansea University Grant: Unassigned Identifier: doi https://doi.org/10.13039/501100001317 Engineering and Physical Sciences Research Council Grant: EP/T028513/1 Identifier: doi https://doi.org/10.13039/501100000266</funders><projectreference/><lastEdited>2024-08-23T10:38:14.1391368</lastEdited><Created>2024-08-23T10:20:34.4294325</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Biosciences, Geography and Physics - Physics</level></path><authors><author><firstname>Drew</firstname><surname>Riley</surname><order>1</order></author><author><firstname>Paul</firstname><surname>Meredith</surname><orcid>0000-0002-9049-7414</orcid><order>2</order></author><author><firstname>Ardalan</firstname><surname>Armin</surname><order>3</order></author></authors><documents><document><filename>67452__31158__91e6a1e4dc38491ea2c0e68567b727e5.pdf</filename><originalFilename>D4NR02467B.pdf</originalFilename><uploaded>2024-08-23T10:20:34.4291409</uploaded><type>Output</type><contentLength>2905518</contentLength><contentType>application/pdf</contentType><version>Version of Record</version><cronfaStatus>true</cronfaStatus><documentNotes>Distributed under the terms of a Creative Commons CC-BY licence.</documentNotes><copyrightCorrect>true</copyrightCorrect><language>eng</language><licence>https://creativecommons.org/licenses/by/3.0/</licence></document></documents><OutputDurs/></rfc1807> |
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v2 67452 2024-08-23 Exciton diffusion in organic semiconductors: precision and pitfalls edca1c48f922393fa2b3cb84d8dc0e4a Drew Riley Drew Riley true false 31e8fe57fa180d418afd48c3af280c2e 0000-0002-9049-7414 Paul Meredith Paul Meredith true false 22b270622d739d81e131bec7a819e2fd Ardalan Armin Ardalan Armin true false 2024-08-23 BGPS Nanometer exciton diffusion is a fundamental process important in virtually all applications of organic semiconductors. Many measurement techniques have been developed to measure exciton diffusion length (LD) at the nanometer scale; however, these techniques have common challenges that the community has worked for decades to overcome. In this perspective, we lay out the principal challenges researchers need to overcome to obtain an accurate measurement of LD. We then examine the most common techniques used to measure LD with respect to these challenges and describe solutions developed to overcome them. This analysis leads to the suggestion that static quenching techniques underestimate LD due to uncertainties in the quenching behavior, while time-resolved exciton–exciton annihilation (EEA) techniques overestimate LD based on experimental conditions, we advance steady-state EEA techniques as an alternative that overcome many of the challenges of these other techniques while preserving accuracy. We support this hypothesis with a meta-analysis of LD measured across various organic semiconductors and measurement techniques. We intend this investigation to provide a framework for researchers to interpret and compare findings across measurement techniques and to guide researchers on how to obtain the most accurate results for each technique in question. Journal Article Nanoscale 0 The Royal Society of Chemistry 2040-3364 2040-3372 Organic semiconductors 13 8 2024 2024-08-13 10.1039/d4nr02467b Mini Review COLLEGE NANME Biosciences Geography and Physics School COLLEGE CODE BGPS Swansea University SU Library paid the OA fee (TA Institutional Deal) European Regional Development Fund Grant: Unassigned Identifier: doi https://doi.org/10.13039/501100008530 Swansea University Grant: Unassigned Identifier: doi https://doi.org/10.13039/501100001317 Engineering and Physical Sciences Research Council Grant: EP/T028513/1 Identifier: doi https://doi.org/10.13039/501100000266 2024-08-23T10:38:14.1391368 2024-08-23T10:20:34.4294325 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics Drew Riley 1 Paul Meredith 0000-0002-9049-7414 2 Ardalan Armin 3 67452__31158__91e6a1e4dc38491ea2c0e68567b727e5.pdf D4NR02467B.pdf 2024-08-23T10:20:34.4291409 Output 2905518 application/pdf Version of Record true Distributed under the terms of a Creative Commons CC-BY licence. true eng https://creativecommons.org/licenses/by/3.0/ |
title |
Exciton diffusion in organic semiconductors: precision and pitfalls |
spellingShingle |
Exciton diffusion in organic semiconductors: precision and pitfalls Drew Riley Paul Meredith Ardalan Armin |
title_short |
Exciton diffusion in organic semiconductors: precision and pitfalls |
title_full |
Exciton diffusion in organic semiconductors: precision and pitfalls |
title_fullStr |
Exciton diffusion in organic semiconductors: precision and pitfalls |
title_full_unstemmed |
Exciton diffusion in organic semiconductors: precision and pitfalls |
title_sort |
Exciton diffusion in organic semiconductors: precision and pitfalls |
author_id_str_mv |
edca1c48f922393fa2b3cb84d8dc0e4a 31e8fe57fa180d418afd48c3af280c2e 22b270622d739d81e131bec7a819e2fd |
author_id_fullname_str_mv |
edca1c48f922393fa2b3cb84d8dc0e4a_***_Drew Riley 31e8fe57fa180d418afd48c3af280c2e_***_Paul Meredith 22b270622d739d81e131bec7a819e2fd_***_Ardalan Armin |
author |
Drew Riley Paul Meredith Ardalan Armin |
author2 |
Drew Riley Paul Meredith Ardalan Armin |
format |
Journal article |
container_title |
Nanoscale |
container_volume |
0 |
publishDate |
2024 |
institution |
Swansea University |
issn |
2040-3364 2040-3372 |
doi_str_mv |
10.1039/d4nr02467b |
publisher |
The Royal Society of Chemistry |
college_str |
Faculty of Science and Engineering |
hierarchytype |
|
hierarchy_top_id |
facultyofscienceandengineering |
hierarchy_top_title |
Faculty of Science and Engineering |
hierarchy_parent_id |
facultyofscienceandengineering |
hierarchy_parent_title |
Faculty of Science and Engineering |
department_str |
School of Biosciences, Geography and Physics - Physics{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Biosciences, Geography and Physics - Physics |
document_store_str |
1 |
active_str |
0 |
description |
Nanometer exciton diffusion is a fundamental process important in virtually all applications of organic semiconductors. Many measurement techniques have been developed to measure exciton diffusion length (LD) at the nanometer scale; however, these techniques have common challenges that the community has worked for decades to overcome. In this perspective, we lay out the principal challenges researchers need to overcome to obtain an accurate measurement of LD. We then examine the most common techniques used to measure LD with respect to these challenges and describe solutions developed to overcome them. This analysis leads to the suggestion that static quenching techniques underestimate LD due to uncertainties in the quenching behavior, while time-resolved exciton–exciton annihilation (EEA) techniques overestimate LD based on experimental conditions, we advance steady-state EEA techniques as an alternative that overcome many of the challenges of these other techniques while preserving accuracy. We support this hypothesis with a meta-analysis of LD measured across various organic semiconductors and measurement techniques. We intend this investigation to provide a framework for researchers to interpret and compare findings across measurement techniques and to guide researchers on how to obtain the most accurate results for each technique in question. |
published_date |
2024-08-13T10:38:13Z |
_version_ |
1808170634569580544 |
score |
11.024221 |