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Application of atomic force microscopy to the study of natural and model soil particles / S CHENG, R BRYANT, S. H DOERR, P. RHODRI WILLIAMS, C. J WRIGHT, Christopher Wright, Stefan Doerr
Journal of Microscopy
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DOI (Published version): 10.1111/j.1365-2818.2008.02051.x
Application of atomic force microscopy to the study of natural and model soil particles
|Published in:||Journal of Microscopy|
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