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Application of atomic force microscopy to the study of natural and model soil particles / S CHENG; R BRYANT; S. H DOERR; P. RHODRI WILLIAMS; C. J WRIGHT

Journal of Microscopy

Swansea University Author: Doerr, Stefan

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DOI (Published version): 10.1111/j.1365-2818.2008.02051.x

Published in: Journal of Microscopy
Published: 2008
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College: College of Science