No Cover Image

Journal article 1081 views

MAC: Magnetostatic Active Contour Model

Xianghua Xie Orcid Logo, M Mirmehdi

IEEE Transactions on Pattern Analysis and Machine Intelligence, Volume: 30, Issue: 4, Pages: 632 - 646

Swansea University Author: Xianghua Xie Orcid Logo

Full text not available from this repository: check for access using links below.

Published in: IEEE Transactions on Pattern Analysis and Machine Intelligence
ISSN: 0162-8828
Published: 2008
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa138
Tags: Add Tag
No Tags, Be the first to tag this record!
Item Description: IEEE Transactions on Pattern Analysis and Machine Intelligence 30(4)
College: Faculty of Science and Engineering
Issue: 4
Start Page: 632
End Page: 646