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Journal article 945 views

MAC: Magnetostatic Active Contour Model

Xianghua Xie Orcid Logo, M Mirmehdi

IEEE Transactions on Pattern Analysis and Machine Intelligence, Volume: 30, Issue: 4, Pages: 632 - 646

Swansea University Author: Xianghua Xie Orcid Logo

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Published in: IEEE Transactions on Pattern Analysis and Machine Intelligence
ISSN: 0162-8828
Published: 2008
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URI: https://cronfa.swan.ac.uk/Record/cronfa138
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Item Description: IEEE Transactions on Pattern Analysis and Machine Intelligence 30(4)
College: Faculty of Science and Engineering
Issue: 4
Start Page: 632
End Page: 646