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Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173
W. Richard Bowen,
Nidal Hilal
Swansea University Author: Nidal Hilal
Abstract
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173
| Published: |
Elsevier
2009
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa17712 |
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| College: |
Faculty of Science and Engineering |
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