Edited book 1029 views
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173
W. Richard Bowen,
Nidal Hilal
Swansea University Author: Nidal Hilal
Abstract
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173
Published: |
Elsevier
2009
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URI: | https://cronfa.swan.ac.uk/Record/cronfa17712 |
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2017-02-01T15:45:18.4508754 v2 17712 2014-04-03 Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 3acba771241d878c8e35ff464aec0342 Nidal Hilal Nidal Hilal true false 2014-04-03 FGSEN Edited book Elsevier 31 12 2009 2009-12-31 COLLEGE NANME Science and Engineering - Faculty COLLEGE CODE FGSEN Swansea University 2017-02-01T15:45:18.4508754 2014-04-03T13:55:46.2336446 Faculty of Science and Engineering School of Engineering and Applied Sciences - Uncategorised W. Richard Bowen 1 Nidal Hilal 2 |
title |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
spellingShingle |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 Nidal Hilal |
title_short |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
title_full |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
title_fullStr |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
title_full_unstemmed |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
title_sort |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
author_id_str_mv |
3acba771241d878c8e35ff464aec0342 |
author_id_fullname_str_mv |
3acba771241d878c8e35ff464aec0342_***_Nidal Hilal |
author |
Nidal Hilal |
author2 |
W. Richard Bowen Nidal Hilal |
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Edited book |
publishDate |
2009 |
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Swansea University |
publisher |
Elsevier |
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Faculty of Science and Engineering |
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facultyofscienceandengineering |
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Faculty of Science and Engineering |
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facultyofscienceandengineering |
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Faculty of Science and Engineering |
department_str |
School of Engineering and Applied Sciences - Uncategorised{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Uncategorised |
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published_date |
2009-12-31T03:20:33Z |
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