Edited book 1346 views
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173
W. Richard Bowen,
Nidal Hilal
Swansea University Author: Nidal Hilal
Abstract
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173
| Published: |
Elsevier
2009
|
|---|---|
| URI: | https://cronfa.swan.ac.uk/Record/cronfa17712 |
| first_indexed |
2015-06-02T01:59:48Z |
|---|---|
| last_indexed |
2018-02-09T04:51:36Z |
| id |
cronfa17712 |
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SURis |
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| spelling |
2017-02-01T15:45:18.4508754 v2 17712 2014-04-03 Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 3acba771241d878c8e35ff464aec0342 Nidal Hilal Nidal Hilal true false 2014-04-03 Edited book Elsevier 31 12 2009 2009-12-31 COLLEGE NANME COLLEGE CODE Swansea University 2017-02-01T15:45:18.4508754 2014-04-03T13:55:46.2336446 Faculty of Science and Engineering School of Engineering and Applied Sciences - Uncategorised W. Richard Bowen 1 Nidal Hilal 2 |
| title |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
| spellingShingle |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 Nidal Hilal |
| title_short |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
| title_full |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
| title_fullStr |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
| title_full_unstemmed |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
| title_sort |
Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products. Publisher: Elsevier. ISBN-13: 978-1856175173 |
| author_id_str_mv |
3acba771241d878c8e35ff464aec0342 |
| author_id_fullname_str_mv |
3acba771241d878c8e35ff464aec0342_***_Nidal Hilal |
| author |
Nidal Hilal |
| author2 |
W. Richard Bowen Nidal Hilal |
| format |
Edited book |
| publishDate |
2009 |
| institution |
Swansea University |
| publisher |
Elsevier |
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Faculty of Science and Engineering |
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facultyofscienceandengineering |
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Faculty of Science and Engineering |
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facultyofscienceandengineering |
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Faculty of Science and Engineering |
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School of Engineering and Applied Sciences - Uncategorised{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Uncategorised |
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2009-12-31T11:03:42Z |
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1850665989255987200 |
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11.088971 |

