Journal article 1128 views
Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal
Kathryn A Whitehead,
Dale Rogers,
John Colligon,
Chris Wright,
Joanna Verran,
Christopher Wright 
Pages: 44 - 53
Swansea University Author:
Christopher Wright
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DOI (Published version): 10.1016/j.colsurfb.2006.05.003
Abstract
Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal
| Published: |
2006
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa1823 |
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| College: |
Faculty of Science and Engineering |
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| Start Page: |
44 |
| End Page: |
53 |