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Journal article 1177 views

Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal

Kathryn A Whitehead, Dale Rogers, John Colligon, Chris Wright, Joanna Verran, Christopher Wright Orcid Logo

Pages: 44 - 53

Swansea University Author: Christopher Wright Orcid Logo

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DOI (Published version): 10.1016/j.colsurfb.2006.05.003

Published: 2006
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College: Faculty of Science and Engineering
Start Page: 44
End Page: 53