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Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics

Yifan Li, R. Y. Fu, D. Winters, B. W. Flynn, B. Parkes, D. S. Brodie, Yufei Liu, J. Terry, L. I. Haworth, A. S. Bunting, J. T. M. Stevenson, S. Smith, C. L. Mackay, P. R. R. Langridge-Smith, A. A. Stokes, A. J. Walton, Yufei Liu

IEEE Transactions on Semiconductor Manufacturing, Volume: 25, Issue: 3, Pages: 323 - 330

Swansea University Author: Yufei Liu

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DOI (Published version): 10.1109/TSM.2012.2202770

Published in: IEEE Transactions on Semiconductor Manufacturing
Published: 2012
URI: https://cronfa.swan.ac.uk/Record/cronfa18343
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first_indexed 2014-09-10T01:58:57Z
last_indexed 2018-02-09T04:52:52Z
id cronfa18343
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spelling 2014-09-09T14:51:22.6441815 v2 18343 2014-09-09 Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics b6e81312388169e1da3e505660e08f32 Yufei Liu Yufei Liu true false 2014-09-09 FGSEN Journal Article IEEE Transactions on Semiconductor Manufacturing 25 3 323 330 31 12 2012 2012-12-31 10.1109/TSM.2012.2202770 COLLEGE NANME Science and Engineering - Faculty COLLEGE CODE FGSEN Swansea University 2014-09-09T14:51:22.6441815 2014-09-09T14:51:22.6441815 Faculty of Science and Engineering School of Engineering and Applied Sciences - Uncategorised Yifan Li 1 R. Y. Fu 2 D. Winters 3 B. W. Flynn 4 B. Parkes 5 D. S. Brodie 6 Yufei Liu 7 J. Terry 8 L. I. Haworth 9 A. S. Bunting 10 J. T. M. Stevenson 11 S. Smith 12 C. L. Mackay 13 P. R. R. Langridge-Smith 14 A. A. Stokes 15 A. J. Walton 16 Yufei Liu 17
title Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics
spellingShingle Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics
Yufei Liu
title_short Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics
title_full Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics
title_fullStr Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics
title_full_unstemmed Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics
title_sort Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics
author_id_str_mv b6e81312388169e1da3e505660e08f32
author_id_fullname_str_mv b6e81312388169e1da3e505660e08f32_***_Yufei Liu
author Yufei Liu
author2 Yifan Li
R. Y. Fu
D. Winters
B. W. Flynn
B. Parkes
D. S. Brodie
Yufei Liu
J. Terry
L. I. Haworth
A. S. Bunting
J. T. M. Stevenson
S. Smith
C. L. Mackay
P. R. R. Langridge-Smith
A. A. Stokes
A. J. Walton
Yufei Liu
format Journal article
container_title IEEE Transactions on Semiconductor Manufacturing
container_volume 25
container_issue 3
container_start_page 323
publishDate 2012
institution Swansea University
doi_str_mv 10.1109/TSM.2012.2202770
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Uncategorised{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Uncategorised
document_store_str 0
active_str 0
published_date 2012-12-31T03:21:29Z
_version_ 1763750644184776704
score 10.997956

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