Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
| Date first appeared online | |
| DOI | 10.1016/j.diamond.2005.11.010 |
| Authors | Guy O. |
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| Date first appeared online | |
| DOI | 10.1016/j.diamond.2005.11.010 |
| Authors | Guy O. |
| Journal Name | |
| Volume |