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Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy / O.J Guy; D Doneddu; L Chen; M.R Jennings; M.P Ackland; R Baylis; M.D Holton; P Dunstan; S.P Wilks; P.A Mawby; Owen Guy

Pages: 1472 - 1477

Swansea University Author: Owen, Guy

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DOI (Published version): 10.1016/j.diamond.2005.11.010

Published: 2006
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College: College of Engineering
Start Page: 1472
End Page: 1477