Journal article 1423 views
Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
O.J Guy,
D Doneddu,
L Chen,
M.R Jennings,
M.P Ackland,
R Baylis,
M.D Holton,
P Dunstan,
S.P Wilks,
P.A Mawby,
Owen Guy
Pages: 1472 - 1477
Swansea University Author: Owen Guy
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DOI (Published version): 10.1016/j.diamond.2005.11.010
Abstract
Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
Published: |
2006
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URI: | https://cronfa.swan.ac.uk/Record/cronfa1843 |
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College: |
Faculty of Science and Engineering |
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Start Page: |
1472 |
End Page: |
1477 |