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The Current Crowding Effect in ZnO Nanowires with a Metal Contact
Materials Today: Proceedings, Volume: 2, Issue: 1, Pages: 309 - 314
Swansea University Authors: Richard Cobley , Karol Kalna
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DOI (Published version): 10.1016/j.matpr.2015.04.052
Abstract
Nanoscale electron tunneling and thermionic transport via the metal-semiconductor interface of ZnO nanowires is found to be strongly affected by the metal contact shape, the metal-semiconductor interface radius and the nanowire radius. Our full 3D simulations show that the current crowding effect oc...
Published in: | Materials Today: Proceedings |
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2015
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URI: | https://cronfa.swan.ac.uk/Record/cronfa23333 |
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2019-05-30T11:38:58.1667551 v2 23333 2015-09-17 The Current Crowding Effect in ZnO Nanowires with a Metal Contact 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 1329a42020e44fdd13de2f20d5143253 0000-0002-6333-9189 Karol Kalna Karol Kalna true false 2015-09-17 EEEG Nanoscale electron tunneling and thermionic transport via the metal-semiconductor interface of ZnO nanowires is found to be strongly affected by the metal contact shape, the metal-semiconductor interface radius and the nanowire radius. Our full 3D simulations show that the current crowding effect occurs for end-bonded contacts due to the geometry variation in the case of Schottky Au-ZnO nanowire interfaces. The change in the geometry will also lead to a change in the electrical behavior of the contact from Schottky to Ohmic which can substantially reduce the contact resistance. Journal Article Materials Today: Proceedings 2 1 309 314 Current crowding, ZnO, simulation 31 12 2015 2015-12-31 10.1016/j.matpr.2015.04.052 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2019-05-30T11:38:58.1667551 2015-09-17T09:51:28.9832298 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering O. Kryvchenkova 1 R.J. Cobley 2 K. Kalna 3 Richard Cobley 0000-0003-4833-8492 4 Karol Kalna 0000-0002-6333-9189 5 0023333-17092015095830.pdf preprint.pdf 2015-09-17T09:58:30.9030000 Output 793492 application/pdf Accepted Manuscript true 2015-09-17T00:00:00.0000000 true |
title |
The Current Crowding Effect in ZnO Nanowires with a Metal Contact |
spellingShingle |
The Current Crowding Effect in ZnO Nanowires with a Metal Contact Richard Cobley Karol Kalna |
title_short |
The Current Crowding Effect in ZnO Nanowires with a Metal Contact |
title_full |
The Current Crowding Effect in ZnO Nanowires with a Metal Contact |
title_fullStr |
The Current Crowding Effect in ZnO Nanowires with a Metal Contact |
title_full_unstemmed |
The Current Crowding Effect in ZnO Nanowires with a Metal Contact |
title_sort |
The Current Crowding Effect in ZnO Nanowires with a Metal Contact |
author_id_str_mv |
2ce7e1dd9006164425415a35fa452494 1329a42020e44fdd13de2f20d5143253 |
author_id_fullname_str_mv |
2ce7e1dd9006164425415a35fa452494_***_Richard Cobley 1329a42020e44fdd13de2f20d5143253_***_Karol Kalna |
author |
Richard Cobley Karol Kalna |
author2 |
O. Kryvchenkova R.J. Cobley K. Kalna Richard Cobley Karol Kalna |
format |
Journal article |
container_title |
Materials Today: Proceedings |
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2 |
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309 |
publishDate |
2015 |
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Swansea University |
doi_str_mv |
10.1016/j.matpr.2015.04.052 |
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Faculty of Science and Engineering |
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Faculty of Science and Engineering |
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facultyofscienceandengineering |
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Faculty of Science and Engineering |
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School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering |
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description |
Nanoscale electron tunneling and thermionic transport via the metal-semiconductor interface of ZnO nanowires is found to be strongly affected by the metal contact shape, the metal-semiconductor interface radius and the nanowire radius. Our full 3D simulations show that the current crowding effect occurs for end-bonded contacts due to the geometry variation in the case of Schottky Au-ZnO nanowire interfaces. The change in the geometry will also lead to a change in the electrical behavior of the contact from Schottky to Ohmic which can substantially reduce the contact resistance. |
published_date |
2015-12-31T03:27:31Z |
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1763751023572156416 |
score |
11.035349 |