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Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry,... / Melanie. J. Bailey, Nicholas J. Bright, Ruth S. Croxton, Simona Francese, Leesa S. Ferguson, Stephen Hinder, Sue Jickells, Benjamin J. Jones, Brian N. Jones, Sergei G. Kazarian, Jesus J. Ojeda, Roger P. Webb, Rosalind Wolstenholme, Stephen Bleay, Jesus Ojeda Ledo

Analytical Chemistry, Volume: 84, Issue: 20, Pages: 8514 - 8523

Swansea University Author: Jesus Ojeda Ledo

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DOI (Published version): 10.1021/ac302441y

Published in: Analytical Chemistry
ISSN: 0003-2700 1520-6882
Published: 2012
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URI: https://cronfa.swan.ac.uk/Record/cronfa24446
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Item Description: @articleRID:0622150816996-43,title = Chemical Characterization of Latent Fingerprints by Matrix-Assisted Laser Desorption Ionization, Time-of-Flight Secondary Ion Mass Spectrometry, Mega Electron Volt Secondary Mass Spectrometry, Gas Chromatography/Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Attenuated Total Reflection Fourier Transform Infrared Spectroscopic Imaging: An Intercomparison,journal = Analytical Chemistry,year = 2012,author = Bailey, Melanie. J. and Bright, Nicholas J. and Croxton, Ruth S. and Francese, Simona and Ferguson, Leesa S. and Hinder, Stephen and Jickells, Sue and Jones, Benjamin J. and Jones, Brian N. and Kazarian, Sergei G. and Ojeda, Jesus J. and Webb, Roger P. and Wolstenholme, Rosalind and Bleay, Stephen,volume = 84,number = 20,pages = 8514-8523
College: College of Engineering
Issue: 20
Start Page: 8514
End Page: 8523