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Commentary: inference in simple step-stress models

A.J. Watkins, Alan Watkins Orcid Logo

IEEE Transactions on Reliability, Volume: 50, Issue: 1, Pages: 36 - 37

Swansea University Author: Alan Watkins Orcid Logo

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DOI (Published version): 10.1109/24.935014

Published in: IEEE Transactions on Reliability
ISSN: 0018-9529 1558-1721
Published: 2001
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College: Faculty of Medicine, Health and Life Sciences
Issue: 1
Start Page: 36
End Page: 37