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Statistical inferences for breakdown voltages

A.J. Watkins, Alan Watkins Orcid Logo

IEEE Transactions on Dielectrics and Electrical Insulation, Volume: 7, Issue: 6, Pages: 869 - 871

Swansea University Author: Alan Watkins Orcid Logo

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DOI (Published version): 10.1109/94.892002

Published in: IEEE Transactions on Dielectrics and Electrical Insulation
ISSN: 10709878
Published: 2000
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URI: https://cronfa.swan.ac.uk/Record/cronfa34287
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College: Faculty of Medicine, Health and Life Sciences
Issue: 6
Start Page: 869
End Page: 871