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Surface sensitivity of four-probe STM resistivity measurements of bulk ZnO correlated to XPS / Alex Lord; Jonathan E Evans; Chris J Barnett; Martin W Allen; Andrew Barron; Steve P Wilks

Journal of Physics: Condensed Matter, Volume: 29, Issue: 38, Start page: 384001

Swansea University Authors: Alex, Lord, Andrew, Barron

Abstract

Multi-probe instruments based on scanning tunnelling microscopy (STM) are becoming increasingly common for their ability to perform nano- to atomic-scale investigations of nanostructures, surfaces and in situ reactions. A common configuration is the four-probe STM often coupled with in situ scanning...

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Published in: Journal of Physics: Condensed Matter
ISSN: 0953-8984 1361-648X
Published: 2017
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa35875
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Abstract: Multi-probe instruments based on scanning tunnelling microscopy (STM) are becoming increasingly common for their ability to perform nano- to atomic-scale investigations of nanostructures, surfaces and in situ reactions. A common configuration is the four-probe STM often coupled with in situ scanning electron microscopy (SEM) that allows precise positioning of the probes onto surfaces and nanostructures enabling electrical and scanning experiments to be performed on highly localised regions of the sample. In this paper, we assess the sensitivity of four-probe STM for in-line resistivity measurements of the bulk ZnO surface. The measurements allow comparisons to established models that are used to relate light plasma treatments (O and H) of the surfaces to the resistivity measurements. The results are correlated to x-ray photoelectron spectroscopy (XPS) and show that four-probe STM can detect changes in surface and bulk conduction mechanisms that are beyond conventional monochromatic XPS.
Keywords: four-probe STM, XPS, ZnO, surface modification, resistivity, oxygen, hydrogen
College: College of Engineering
Issue: 38
Start Page: 384001