Journal article 1417 views 173 downloads
Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures
IEEE Access, Volume: 5, Issue: October, Pages: 20946 - 20952
Swansea University Author:
Karol Kalna
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DOI (Published version): 10.1109/ACCESS.2017.2755984
Abstract
Abstract:The interplay of self-heating and polarization affecting resistance is studied in AlGaN/GaN Transmission Line Model (TLM) heterostructures with a scaled source-to-drain distance. The study is based on meticulously calibrated TCAD simulations against I-V experimental data using an electrothe...
Published in: | IEEE Access |
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ISSN: | 2169-3536 |
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IEEE
2017
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URI: | https://cronfa.swan.ac.uk/Record/cronfa36147 |
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<?xml version="1.0"?><rfc1807><datestamp>2022-10-10T15:49:15.1090914</datestamp><bib-version>v2</bib-version><id>36147</id><entry>2017-10-18</entry><title>Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures</title><swanseaauthors><author><sid>1329a42020e44fdd13de2f20d5143253</sid><ORCID>0000-0002-6333-9189</ORCID><firstname>Karol</firstname><surname>Kalna</surname><name>Karol Kalna</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2017-10-18</date><deptcode>EEEG</deptcode><abstract>Abstract:The interplay of self-heating and polarization affecting resistance is studied in AlGaN/GaN Transmission Line Model (TLM) heterostructures with a scaled source-to-drain distance. The study is based on meticulously calibrated TCAD simulations against I-V experimental data using an electrothermal model. The electro-thermal simulations show hot-spots (with peak temperature in a range of ~ 566 K - 373 K) at the edge of the drain contact due to a large electric field. The electrical stress on Ohmic contacts reduces the total polarization, leading to the inverse/converse piezoelectric effect. This inverse effect decreases the polarization by 7 %, 10 %, and 17 % during a scaling of the source-to-drain distance in the 12 μm, 8μm and 4 μm TLM heterostructures, respectively, when compared to the largest 18 μm heterostructure.</abstract><type>Journal Article</type><journal>IEEE Access</journal><volume>5</volume><journalNumber>October</journalNumber><paginationStart>20946</paginationStart><paginationEnd>20952</paginationEnd><publisher>IEEE</publisher><placeOfPublication>New York</placeOfPublication><isbnPrint/><isbnElectronic/><issnPrint/><issnElectronic>2169-3536</issnElectronic><keywords>III-V Nitrides, Self-Heating, Polarization, TLM Structures, Electro-Thermal Transport Simulations</keywords><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2017</publishedYear><publishedDate>2017-12-31</publishedDate><doi>10.1109/ACCESS.2017.2755984</doi><url>https://ieeexplore.ieee.org/document/8055440</url><notes/><college>COLLEGE NANME</college><department>Electronic and Electrical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEEG</DepartmentCode><institution>Swansea University</institution><apcterm/><funders/><projectreference/><lastEdited>2022-10-10T15:49:15.1090914</lastEdited><Created>2017-10-18T09:34:17.0303676</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering</level></path><authors><author><firstname>K.</firstname><surname>Ahmeda</surname><order>1</order></author><author><firstname>B.</firstname><surname>Ubochi</surname><order>2</order></author><author><firstname>B.</firstname><surname>Benbakhti</surname><order>3</order></author><author><firstname>S. J.</firstname><surname>Duffy</surname><order>4</order></author><author><firstname>A.</firstname><surname>Soltani</surname><order>5</order></author><author><firstname>W.</firstname><surname>Zhang</surname><order>6</order></author><author><firstname>Karol</firstname><surname>Kalna</surname><orcid>0000-0002-6333-9189</orcid><order>7</order></author></authors><documents><document><filename>0036147-18102017093806.pdf</filename><originalFilename>ahmed2017(2).pdf</originalFilename><uploaded>2017-10-18T09:38:06.8370000</uploaded><type>Output</type><contentLength>871147</contentLength><contentType>application/pdf</contentType><version>Version of Record</version><cronfaStatus>true</cronfaStatus><embargoDate>2017-10-18T00:00:00.0000000</embargoDate><copyrightCorrect>true</copyrightCorrect><language>eng</language></document></documents><OutputDurs/></rfc1807> |
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2022-10-10T15:49:15.1090914 v2 36147 2017-10-18 Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures 1329a42020e44fdd13de2f20d5143253 0000-0002-6333-9189 Karol Kalna Karol Kalna true false 2017-10-18 EEEG Abstract:The interplay of self-heating and polarization affecting resistance is studied in AlGaN/GaN Transmission Line Model (TLM) heterostructures with a scaled source-to-drain distance. The study is based on meticulously calibrated TCAD simulations against I-V experimental data using an electrothermal model. The electro-thermal simulations show hot-spots (with peak temperature in a range of ~ 566 K - 373 K) at the edge of the drain contact due to a large electric field. The electrical stress on Ohmic contacts reduces the total polarization, leading to the inverse/converse piezoelectric effect. This inverse effect decreases the polarization by 7 %, 10 %, and 17 % during a scaling of the source-to-drain distance in the 12 μm, 8μm and 4 μm TLM heterostructures, respectively, when compared to the largest 18 μm heterostructure. Journal Article IEEE Access 5 October 20946 20952 IEEE New York 2169-3536 III-V Nitrides, Self-Heating, Polarization, TLM Structures, Electro-Thermal Transport Simulations 31 12 2017 2017-12-31 10.1109/ACCESS.2017.2755984 https://ieeexplore.ieee.org/document/8055440 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2022-10-10T15:49:15.1090914 2017-10-18T09:34:17.0303676 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering K. Ahmeda 1 B. Ubochi 2 B. Benbakhti 3 S. J. Duffy 4 A. Soltani 5 W. Zhang 6 Karol Kalna 0000-0002-6333-9189 7 0036147-18102017093806.pdf ahmed2017(2).pdf 2017-10-18T09:38:06.8370000 Output 871147 application/pdf Version of Record true 2017-10-18T00:00:00.0000000 true eng |
title |
Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures |
spellingShingle |
Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures Karol Kalna |
title_short |
Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures |
title_full |
Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures |
title_fullStr |
Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures |
title_full_unstemmed |
Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures |
title_sort |
Role of Self-Heating and Polarization in AlGaN/GaN Based Heterostructures |
author_id_str_mv |
1329a42020e44fdd13de2f20d5143253 |
author_id_fullname_str_mv |
1329a42020e44fdd13de2f20d5143253_***_Karol Kalna |
author |
Karol Kalna |
author2 |
K. Ahmeda B. Ubochi B. Benbakhti S. J. Duffy A. Soltani W. Zhang Karol Kalna |
format |
Journal article |
container_title |
IEEE Access |
container_volume |
5 |
container_issue |
October |
container_start_page |
20946 |
publishDate |
2017 |
institution |
Swansea University |
issn |
2169-3536 |
doi_str_mv |
10.1109/ACCESS.2017.2755984 |
publisher |
IEEE |
college_str |
Faculty of Science and Engineering |
hierarchytype |
|
hierarchy_top_id |
facultyofscienceandengineering |
hierarchy_top_title |
Faculty of Science and Engineering |
hierarchy_parent_id |
facultyofscienceandengineering |
hierarchy_parent_title |
Faculty of Science and Engineering |
department_str |
School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering |
url |
https://ieeexplore.ieee.org/document/8055440 |
document_store_str |
1 |
active_str |
0 |
description |
Abstract:The interplay of self-heating and polarization affecting resistance is studied in AlGaN/GaN Transmission Line Model (TLM) heterostructures with a scaled source-to-drain distance. The study is based on meticulously calibrated TCAD simulations against I-V experimental data using an electrothermal model. The electro-thermal simulations show hot-spots (with peak temperature in a range of ~ 566 K - 373 K) at the edge of the drain contact due to a large electric field. The electrical stress on Ohmic contacts reduces the total polarization, leading to the inverse/converse piezoelectric effect. This inverse effect decreases the polarization by 7 %, 10 %, and 17 % during a scaling of the source-to-drain distance in the 12 μm, 8μm and 4 μm TLM heterostructures, respectively, when compared to the largest 18 μm heterostructure. |
published_date |
2017-12-31T03:45:08Z |
_version_ |
1763752132016603136 |
score |
11.021648 |