Journal article 835 views
Probing individual point defects in graphene via near-field Raman scattering
Sandro Mignuzzi,
Naresh Kumar,
Barry Brennan,
Ian S. Gilmore,
David Richards,
Andrew J. Pollard,
Deb Roy 
Nanoscale, Volume: 7, Issue: 46, Pages: 19413 - 19418
Swansea University Author:
Deb Roy
Full text not available from this repository: check for access using links below.
DOI (Published version): 10.1039/c5nr04664e
Abstract
Probing individual point defects in graphene via near-field Raman scattering
| Published in: | Nanoscale |
|---|---|
| ISSN: | 2040-3364 2040-3372 |
| Published: |
2015
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| Online Access: |
Check full text
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| URI: | https://cronfa.swan.ac.uk/Record/cronfa37212 |
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| College: |
Faculty of Science and Engineering |
|---|---|
| Issue: |
46 |
| Start Page: |
19413 |
| End Page: |
19418 |