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Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach

S. Barazza, Stefano Barazza Orcid Logo

Journal of Intellectual Property Law & Practice, Volume: 9, Issue: 1, Pages: 6 - 11

Swansea University Author: Stefano Barazza Orcid Logo

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DOI (Published version): 10.1093/jiplp/jpt223

Published in: Journal of Intellectual Property Law & Practice
ISSN: 1747-1532 1747-1540
Published: 2013
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URI: https://cronfa.swan.ac.uk/Record/cronfa40865
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College: Faculty of Humanities and Social Sciences
Issue: 1
Start Page: 6
End Page: 11