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Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach

S. Barazza, Stefano Barazza Orcid Logo

Journal of Intellectual Property Law & Practice, Volume: 9, Issue: 1, Pages: 6 - 11

Swansea University Author: Stefano Barazza Orcid Logo

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DOI (Published version): 10.1093/jiplp/jpt223

Published in: Journal of Intellectual Property Law & Practice
ISSN: 1747-1532 1747-1540
Published: 2013
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URI: https://cronfa.swan.ac.uk/Record/cronfa40865
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first_indexed 2018-06-28T13:30:42Z
last_indexed 2023-01-11T14:17:32Z
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spelling 2023-01-03T16:49:41.3240777 v2 40865 2018-06-28 Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach 046b20d2b784569fcb252fc7169e95e4 0000-0003-2690-0720 Stefano Barazza Stefano Barazza true false 2018-06-28 LAWD Journal Article Journal of Intellectual Property Law &amp; Practice 9 1 6 11 1747-1532 1747-1540 31 12 2013 2013-12-31 10.1093/jiplp/jpt223 COLLEGE NANME Law COLLEGE CODE LAWD Swansea University 2023-01-03T16:49:41.3240777 2018-06-28T11:25:11.1969931 Faculty of Humanities and Social Sciences Hilary Rodham Clinton School of Law S. Barazza 1 Stefano Barazza 0000-0003-2690-0720 2
title Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach
spellingShingle Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach
Stefano Barazza
title_short Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach
title_full Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach
title_fullStr Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach
title_full_unstemmed Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach
title_sort Further steps towards a uniform approach to RAND rates for standard-essential patents in the USA: the alternative 'top down' approach
author_id_str_mv 046b20d2b784569fcb252fc7169e95e4
author_id_fullname_str_mv 046b20d2b784569fcb252fc7169e95e4_***_Stefano Barazza
author Stefano Barazza
author2 S. Barazza
Stefano Barazza
format Journal article
container_title Journal of Intellectual Property Law &amp; Practice
container_volume 9
container_issue 1
container_start_page 6
publishDate 2013
institution Swansea University
issn 1747-1532
1747-1540
doi_str_mv 10.1093/jiplp/jpt223
college_str Faculty of Humanities and Social Sciences
hierarchytype
hierarchy_top_id facultyofhumanitiesandsocialsciences
hierarchy_top_title Faculty of Humanities and Social Sciences
hierarchy_parent_id facultyofhumanitiesandsocialsciences
hierarchy_parent_title Faculty of Humanities and Social Sciences
department_str Hilary Rodham Clinton School of Law{{{_:::_}}}Faculty of Humanities and Social Sciences{{{_:::_}}}Hilary Rodham Clinton School of Law
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published_date 2013-12-31T03:52:03Z
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